Authors:
OVERBURY SH
RADULOVIC PV
THEVUTHASAN S
HERMAN GS
HENDERSON MA
PEDEN CHF
Citation: Sh. Overbury et al., ION-SCATTERING STUDY OF THE ZN AND OXYGEN-TERMINATED BASAL-PLANE SURFACES OF ZNO, Surface science, 410(1), 1998, pp. 106-122
Authors:
THEVUTHASAN S
HERMAN GS
KIM YJ
CHAMBERS SA
PEDEN CHF
WANG Z
YNZUNZA RX
TOBER ED
MORAIS J
FADLEY CS
Citation: S. Thevuthasan et al., THE STRUCTURE OF FORMATE ON TIO2(110) BY SCANNED-ENERGY AND SCANNED-ANGLE PHOTOELECTRON DIFFRACTION, Surface science, 401(2), 1998, pp. 261-268
Authors:
CHAMBERS SA
THEVUTHASAN S
KIM YJ
HERMAN GS
WANG Z
TOBER E
YNZUNZA R
MORAIS J
PEDEN CHF
FERRIS K
FADLEY CS
Citation: Sa. Chambers et al., CHEMISORPTION GEOMETRY OF FORMATE ON TIO2(110) BY PHOTOELECTRON DIFFRACTION, Chemical physics letters, 267(1-2), 1997, pp. 51-57
Authors:
HERMAN GS
GALLAGHER MC
JOYCE SA
PEDEN CHF
Citation: Gs. Herman et al., STRUCTURE OF EPITAXIAL THIN TIO2 FILMS ON W(110) AS STUDIED BY LOW-ENERGY-ELECTRON DIFFRACTION AND SCANNING-TUNNELING-MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1126-1130
Authors:
WOICIK JC
KENDELEWICZ T
YOSHIKAWA SA
MIYANO KE
HERMAN GS
COWAN PL
PIANETTA P
SPICER WE
Citation: Jc. Woicik et al., SURFACE-SENSITIVE X-RAY STANDING-WAVE STUDY OF SI(111)ROOT-3X-ROOT-3-AG, Physical review. B, Condensed matter, 53(23), 1996, pp. 15425-15428
Citation: Gs. Herman et Chf. Peden, GROWTH OF THIN FI FILMS ON W(110) AND O W(110)/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(4), 1994, pp. 2087-2090
Authors:
HERMAN GS
WOICIK JC
ANDREWS AB
ERSKINE JL
Citation: Gs. Herman et al., HIGH-RESOLUTION PHOTOELECTRON-SPECTROSCOPY STUDY OF (ROOT-3X-ROOT-3) R30-DEGREES-AG ON SI(111), Surface science, 290(1-2), 1993, pp. 643-648
Authors:
SEELY JF
GUTMAN G
WOOD J
HERMAN GS
KOWALSKI MP
RIFE JC
HUNTER WR
Citation: Jf. Seely et al., NORMAL-INCIDENCE REFLECTANCE OF W B4C MULTILAYER MIRRORS IN THE 34-50-ANGSTROM WAVELENGTH REGION/, Applied optics, 32(19), 1993, pp. 3541-3543