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Results: 1-10 |
Results: 10
TEM INVESTIGATIONS ON THE HETEROEPITAXIAL NUCLEATION OF CVD DIAMOND ON (001)-SILICON SUBSTRATES
Authors: WURZINGER P FUCHS N PONGRATZ P SCHRECK M HESSMER R STRITZKER B
Citation: P. Wurzinger et al., TEM INVESTIGATIONS ON THE HETEROEPITAXIAL NUCLEATION OF CVD DIAMOND ON (001)-SILICON SUBSTRATES, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 752-757
AFM STUDY ON THE NONMONOTONIC TEXTURE EVOLUTION OF HETEROEPITAXIALLY NUCLEATED DIAMOND FILMS
Authors: KLARMANN R SCHRECK M HESSMER R STRITZKER B
Citation: R. Klarmann et al., AFM STUDY ON THE NONMONOTONIC TEXTURE EVOLUTION OF HETEROEPITAXIALLY NUCLEATED DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 5(3-5), 1996, pp. 266-271
STUDY OF THE INITIAL GROWTH-PHASE OF CHEMICAL-VAPOR-DEPOSITED DIAMONDON SILICON(001) BY SYNCHROTRON-RADIATION
Authors: GEIER S HESSMER R PRECKWINKEL U SCHWEITZER D SCHRECK M RAUSCHENBACH B
Citation: S. Geier et al., STUDY OF THE INITIAL GROWTH-PHASE OF CHEMICAL-VAPOR-DEPOSITED DIAMONDON SILICON(001) BY SYNCHROTRON-RADIATION, Journal of applied physics, 79(4), 1996, pp. 1907-1910
THE INFLUENCE OF THE GROWTH-PROCESS ON THE FILM TEXTURE OF EPITAXIALLY NUCLEATED DIAMOND ON SILICON(001)
Authors: HESSMER R SCHRECK M GEIER S RAUSCHENBACH B STRITZKER B
Citation: R. Hessmer et al., THE INFLUENCE OF THE GROWTH-PROCESS ON THE FILM TEXTURE OF EPITAXIALLY NUCLEATED DIAMOND ON SILICON(001), DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 410-415
INDICATIONS OF NONMONOTONIC TEXTURE EVOLUTION FROM A 2-DIMENSIONAL SIMULATION STUDY
Authors: HESSMER R SCHRECK M STRITZKER B
Citation: R. Hessmer et al., INDICATIONS OF NONMONOTONIC TEXTURE EVOLUTION FROM A 2-DIMENSIONAL SIMULATION STUDY, DIAMOND AND RELATED MATERIALS, 4(4), 1995, pp. 416-418
X-RAY-IMAGING OF POLYCRYSTALLINE MATERIALS
Authors: WROBLEWSKI T GEIER S HESSMER R SCHRECK M RAUSCHENBACH B
Citation: T. Wroblewski et al., X-RAY-IMAGING OF POLYCRYSTALLINE MATERIALS, Review of scientific instruments, 66(6), 1995, pp. 3560-3562
TEXTURE ANALYSIS OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICONBY THE COMPONENT METHOD
Authors: HELMING K GEIER S SCHRECK M HESSMER R STRITZKER B RAUSCHENBACH B
Citation: K. Helming et al., TEXTURE ANALYSIS OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICONBY THE COMPONENT METHOD, Journal of applied physics, 77(9), 1995, pp. 4765-4770
STRUCTURAL CHARACTERIZATION OF DIAMOND FILMS GROWN EPITAXIALLY ON SILICON
Authors: SCHRECK M HESSMER R GEIER S RAUSCHENBACH B STRITZKER B
Citation: M. Schreck et al., STRUCTURAL CHARACTERIZATION OF DIAMOND FILMS GROWN EPITAXIALLY ON SILICON, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 510-514
CORRELATION BETWEEN BREAKDOWN VOLTAGE AND STRUCTURAL-PROPERTIES OF POLYCRYSTALLINE AND HETEROEPITAXIAL CVD DIAMOND FILMS
Authors: HESSMER R SCHRECK M GEIER S STRITZKER B
Citation: R. Hessmer et al., CORRELATION BETWEEN BREAKDOWN VOLTAGE AND STRUCTURAL-PROPERTIES OF POLYCRYSTALLINE AND HETEROEPITAXIAL CVD DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 951-956
CHARACTERIZATION OF THE NEAR-INTERFACE REGION OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICON BY BACKSCATTER KIKUCHI DIFFRACTION
Authors: GEIER S SCHRECK M HESSMER R RAUSCHENBACH B STRITZKER B KUNZE K ADAMS BL
Citation: S. Geier et al., CHARACTERIZATION OF THE NEAR-INTERFACE REGION OF CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS ON SILICON BY BACKSCATTER KIKUCHI DIFFRACTION, Applied physics letters, 65(14), 1994, pp. 1781-1783
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