Authors:
DREVS H
MORKE W
JARSETZ J
BIERUTA T
HOFMEISTER H
Citation: H. Drevs et al., CHARACTERIZATION OF NANOSIZED NICKEL PREPARED BY SURFACE-REACTIONS OFNI-SIGMA-ORGANYL COMPLEXES ON SILICA - AN ELECTRON-PARAMAGNETIC AND FERROMAGNETIC-RESONANCE STUDY, Applied organometallic chemistry, 12(5), 1998, pp. 321-325
Citation: H. Hofmeister, 40 YEARS STUDY OF FIVEFOLD TWINNED STRUCTURES IN SMALL PARTICLES AND THIN-FILMS, Crystal research and technology, 33(1), 1998, pp. 3-25
Citation: H. Hofmeister et al., STRUCTURE OF NANOMETERSIZED SILICON PARTICLES PREPARED BY VARIOUS GAS-PHASE PROCESSES, Journal of non-crystalline solids, 234, 1998, pp. 182-187
Citation: G. Rupprechter et al., ELECTRON-MICROSCOPY OF THIN-FILM MODEL CATALYSTS - ACTIVATION OF ALUMINA-SUPPORTED RHODIUM NANOPARTICLES, Journal of catalysis, 173(2), 1998, pp. 409-422
Citation: G. Rupprechter et al., CHARACTERIZATION OF OXIDE-SUPPORTED RHODIUM NANOCRYSTALS - HABIT, SURFACE-STRUCTURE AND CATALYTIC ACTIVITY, Nanostructured materials, 9(1-8), 1997, pp. 311-314
Authors:
DUTTA J
HOFMANN H
HOURIET R
HOFMEISTER H
HOLLENSTEIN C
Citation: J. Dutta et al., GROWTH, MICROSTRUCTURE AND SINTERING BEHAVIOR OF NANOSIZED SILICON POWDERS, Colloids and surfaces. A, Physicochemical and engineering aspects, 127(1-3), 1997, pp. 263-272
Citation: M. Dubiel et al., COMPRESSIVE STRESSES IN AG NANOPARTICLE DOPED GLASSES BY ION-IMPLANTATION, Physica status solidi. b, Basic research, 203(2), 1997, pp. 5-6
Citation: G. Rupprechter et al., HRTEM AND AFM STUDY OF EPITAXIALLY GROWN RN-AL2O3 THIN-LAYER MODEL CATALYSTS, European journal of cell biology, 74, 1997, pp. 50-50
Citation: H. Hofmeister et al., HREM STUDY OF ELLIPSOID SILVER PARTICLES IN TENSILE-STRAINED GLASS, European journal of cell biology, 74, 1997, pp. 128-128
Citation: H. Hofmeister et al., SYNTHESIS AND STRUCTURAL CHARACTERIZATION OF SI AND SIOX PARTICLES OFNANOMETER SIZES, Berichte der Bunsengesellschaft fur Physikalische Chemie, 101(11), 1997, pp. 1647-1650
Citation: H. Hofmeister et al., SYNTHESIS OF NANOSIZED SILVER PARTICLES IN ION-EXCHANGED GLASS BY ELECTRON-BEAM IRRADIATION, Applied physics letters, 70(13), 1997, pp. 1694-1696
Authors:
DUTTA J
HOFMANN H
HOURIET R
VALMALETTE JC
HOFMEISTER H
Citation: J. Dutta et al., CRYSTALLIZATION OF NANOSIZED SILICON POWDER PREPARED BY PLASMA-INDUCED CLUSTERING REACTIONS, AIChE journal, 43(11), 1997, pp. 2610-2615
Citation: Ma. Rosler et al., INVESTIGATION OF THE OXIDE LAYER STRUCTURE OF IRON PIGMENTS BY HIGH-RESOLUTION TEM, Journal of magnetism and magnetic materials, 162(2-3), 1996, pp. 377-382
Authors:
HILLEBRAND R
WERNER P
HOFMEISTER H
GOSELE U
Citation: R. Hillebrand et al., A FUZZY-LOGIC APPROACH TO IMAGE-ANALYSIS OF HREM MICROGRAPHS OF III-VCOMPOUNDS, Ultramicroscopy, 66(1-2), 1996, pp. 73-88
Citation: H. Hofmeister et al., ATOMIC-STRUCTURE OF AMORPHOUS NANOSIZED SILICON POWDERS UPON THERMAL-TREATMENT, Physical review. B, Condensed matter, 54(4), 1996, pp. 2856-2862
Authors:
NEUMANN W
HOFMEISTER H
CONRAD D
SCHEERSCHMIDT K
RUVIMOV S
Citation: W. Neumann et al., CHARACTERIZATION OF INTERFACE STRUCTURES IN NANOCRYSTALLINE GERMANIUMBY MEANS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY AND MOLECULAR-DYNAMICS SIMULATIONS, Zeitschrift fur Kristallographie, 211(3), 1996, pp. 147-152
Citation: H. Hofmeister et al., 2-DIMENSIONAL REGULAR ARRAYS OF NANOSCALE METAL PARTICLES BY ORDERED NUCLEATION ON RECONSTRUCTED SURFACES, Nanostructured materials, 6(1-4), 1995, pp. 529-532
Citation: R. Hillebrand et H. Hofmeister, QUANTITATIVE-ANALYSIS OF HREM IMAGES - MEASURES OF SIMILARITY, Physica status solidi. a, Applied research, 150(1), 1995, pp. 65-76
Citation: H. Hofmeister et T. Junghanns, FORMATION OF NANOCRYSTALLINE STRUCTURES IN AMORPHOUS THIN-FILMS OF GERMANIUM, Journal of non-crystalline solids, 193, 1995, pp. 550-555