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Results:
1-7
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Results: 7
Authors:
HOLMESTAD R
BIRKELAND CR
Citation: R. Holmestad et Cr. Birkeland, CHARGE-DENSITY DETERMINATION IN TIAL-CR AND TIAL-V USING QUANTITATIVECONVERGENT-BEAM ELECTRON-DIFFRACTION, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 77(5), 1998, pp. 1231-1254
Authors:
LIE K
HOLMESTAD R
MARTHINSEN K
HOIER R
Citation: K. Lie et al., EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF EELS NEAR-EDGE FINE-STRUCTURE IN TIAL WITH AND WITHOUT TERNARY ADDITION OF V, CR, OR MN, Physical review. B, Condensed matter, 57(3), 1998, pp. 1585-1593
Authors:
ZUO JM
KIM M
HOLMESTAD R
Citation: Jm. Zuo et al., A NEW APPROACH TO LATTICE-PARAMETER MEASUREMENTS USING DYNAMIC ELECTRON-DIFFRACTION AND PATTERN-MATCHING, Journal of Electron Microscopy, 47(2), 1998, pp. 121-127
Authors:
BIRKELAND C
HOLMESTAD R
MARTHINSEN K
HOIER R
Citation: C. Birkeland et al., EFFICIENT BEAM-SELECTION CRITERIA IN QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Ultramicroscopy, 66(1-2), 1996, pp. 89-99
Authors:
HOLMESTAD R
ZUO JM
SPENCE JCH
HOIER R
HORITA Z
Citation: R. Holmestad et al., EFFECT OF MN DOPING ON CHARGE-DENSITY IN GAMMA-TIAL BY QUANTITATIVE CONVERGENT-BEAM ELECTRON-DIFFRACTION, Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties, 72(3), 1995, pp. 579-601
Authors:
MARTHINSEN K
HOLMESTAD R
HOIER R
Citation: K. Marthinsen et al., ANALYTICAL FILTERING OF LOW-ANGLE INELASTIC-SCATTERING CONTRIBUTIONS TO CBED CONTRAST, Ultramicroscopy, 55(3), 1994, pp. 268-275
Authors:
HOLMESTAD R
KRIVANEK OL
HOIER R
MARTHINSEN K
SPENCE JCH
Citation: R. Holmestad et al., COMMERCIAL SPECTROMETER MODIFICATIONS FOR ENERGY-FILTERING OF ELECTRON-DIFFRACTION PATTERNS AND IMAGES, Ultramicroscopy, 52(3-4), 1993, pp. 454-458
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1-7
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