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Results:
1-7
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Results: 7
Authors:
AN I
LEE JC
HONG BY
COLLINS RW
Citation: I. An et al., SIMULTANEOUS DETERMINATION OF REFLECTANCE SPECTRA ALONG WITH (PSI(E),DELTA(E)) IN MULTICHANNEL ELLIPSOMETRY - APPLICATIONS TO INSTRUMENT CALIBRATION AND REDUCTION OF REAL-TIME DATA, Thin solid films, 313, 1998, pp. 79-84
Authors:
LEE J
HONG BY
MESSIER R
COLLINS RW
Citation: J. Lee et al., APPLICATION OF REAL-TIME SPECTROSCOPIC ELLIPSOMETRY FOR THE DEVELOPMENT OF LOW-TEMPERATURE DIAMOND FILM GROWTH-PROCESSES, Thin solid films, 313, 1998, pp. 506-510
Authors:
HONG BY
LEE J
COLLINS RW
KUANG YL
DRAWL W
MESSIER R
TSONG TT
STRAUSSER YE
Citation: By. Hong et al., EFFECTS OF PROCESSING CONDITIONS ON THE GROWTH OF NANOCRYSTALLINE DIAMOND THIN-FILMS - REAL-TIME SPECTROSCOPIC ELLIPSOMETRY STUDIES, DIAMOND AND RELATED MATERIALS, 6(1), 1997, pp. 55-80
Authors:
LEE JC
HONG BY
MESSIER R
COLLINS RW
Citation: Jc. Lee et al., REAL-TIME SPECTROELLIPSOMETRY FOR OPTIMIZATION OF DIAMOND FILM GROWTHBY MICROWAVE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION FROM CO H-2 MIXTURES/, Journal of applied physics, 80(11), 1996, pp. 6489-6495
Authors:
LEE JC
HONG BY
MESSIER R
COLLINS RW
Citation: Jc. Lee et al., NUCLEATION AND BULK FILM GROWTH-KINETICS OF NANOCRYSTALLINE DIAMOND PREPARED BY MICROWAVE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION ON SILICON SUBSTRATES, Applied physics letters, 69(12), 1996, pp. 1716-1718
Authors:
HONG BY
WAKAGI M
DRAWL W
MESSIER R
COLLINS RW
Citation: By. Hong et al., REAL-TIME SPECTROELLIPSOMETRY STUDY OF THE EVOLUTION OF BONDING IN DIAMOND THIN-FILMS DURING NUCLEATION AND GROWTH, Physical review letters, 75(6), 1995, pp. 1122-1125
Authors:
HONG BY
WAKAGI M
COLLINS RW
AN I
ENGDAHL NC
DRAWL W
MESSIER R
Citation: By. Hong et al., REAL-TIME SPECTROSCOPIC ELLIPSOMETRY STUDIES OF DIAMOND FILM GROWTH BY MICROWAVE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION, DIAMOND AND RELATED MATERIALS, 3(4-6), 1994, pp. 431-437
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1-7
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