Authors: TAKANO H NAKANO H MINAMI H HOSOGI K YOSHIDA N SATO K HIROSE Y TSUBOUCHI N

Citation: H. Takano et al., ELECTRON-BEAM ULTRAVIOLET HYBRID EXPOSURE COMBINED WITH NOVEL BILAYERRESIST SYSTEM FOR A 0.15-MU-M T-SHAPED GATE FABRICATION PROCESS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(6), 1996, pp. 3483-3488

Authors: SHIMADA M HIGASHISAKA N OHTA A HOSOGI K KUBO K TANINO N TAKAGI T HIDANI F ISHIHARA O

Citation: M. Shimada et al., GAAS 10 GB S 64/1 MULTIPLEXER/DEMULTIPLEXER CHIP SETS/, IEICE transactions on electronics, E79C(4), 1996, pp. 503-511

Authors: TAKANO H HOSOGI K KATO T OKU T KOHNO Y NAKANO H SATO K FUNADA M ISHIHARA O TSUBOUCHI N

Citation: H. Takano et al., NOVEL WSI AU T-SHAPED GATE GAAS METAL-SEMICONDUCTOR FIELD-EFFECT-TRANSISTOR FABRICATION PROCESS FOR SUPER LOW-NOISE MICROWAVE MONOLITHIC INTEGRATED-CIRCUIT AMPLIFIERS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 1014-1017

Authors: HIGASHISAKA N SHIMADA M OHTA A HOSOGI K KUBO K TANINO N

Citation: N. Higashisaka et al., LOW-POWER DISSIPATION GAAS DCFL 2.5GBPS 16-BIT MULTIPLEXER DEMULTIPLEXER LSIS/, IEICE transactions on electronics, E78C(9), 1995, pp. 1195-1202

Authors: ISHIKAWA T HOSOGI K KATSUMATA M MINAMI H MITSUI Y

Citation: T. Ishikawa et al., A STUDY ON RELIABILITY AND FAILURE-MECHANISM OF T-SHAPED GATE HEMTS, IEICE transactions on fundamentals of electronics, communications and computer science, E77A(1), 1994, pp. 158-165

Authors: HIGASHISAKA N SHIMADA M OHTA A HOSOGI K TOBITA Y MITSUI Y

Citation: N. Higashisaka et al., GAAS DCFL 2.5 GBPS 16-BIT MULTIPLEXER DEMULTIPLEXER LSIS, IEEE journal of solid-state circuits, 29(7), 1994, pp. 808-814