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Results: 1-14 |
Results: 14
OBSERVATIONS OF PARTIAL DISLOCATIONS AND BASAL TWIN BOUNDARIES IN SHOCK-WAVE-DEFORMED SAPPHIRE
Authors: CHEN SJ HOWITT DG
Citation: Sj. Chen et Dg. Howitt, OBSERVATIONS OF PARTIAL DISLOCATIONS AND BASAL TWIN BOUNDARIES IN SHOCK-WAVE-DEFORMED SAPPHIRE, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 78(3), 1998, pp. 765-776
MICROJOINERY - CONCEPT, DEFINITION, AND APPLICATION TO MICROSYSTEM DEVELOPMENT
Authors: GONZALEZ C SMITH RL HOWITT DG COLLINS SD
Citation: C. Gonzalez et al., MICROJOINERY - CONCEPT, DEFINITION, AND APPLICATION TO MICROSYSTEM DEVELOPMENT, Sensors and actuators. A, Physical, 66(1-3), 1998, pp. 315-332
ORIENTATION-DEPENDENCE OF ELASTIC STRAIN-ENERGY IN HEXAGONAL AND CUBIC BORON-NITRIDE LAYERS IN ENERGETICALLY DEPOSITED BN FILMS
Authors: CARDINALE GF MEDLIN DL MIRKARIMI PB MCCARTY KF HOWITT DG
Citation: Gf. Cardinale et al., ORIENTATION-DEPENDENCE OF ELASTIC STRAIN-ENERGY IN HEXAGONAL AND CUBIC BORON-NITRIDE LAYERS IN ENERGETICALLY DEPOSITED BN FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(1), 1997, pp. 196-200
THE SURFACE-ANALYSIS OF COPPER-ARC BEADS - A CRITICAL-REVIEW
Authors: HOWITT DG
Citation: Dg. Howitt, THE SURFACE-ANALYSIS OF COPPER-ARC BEADS - A CRITICAL-REVIEW, Journal of forensic sciences, 42(4), 1997, pp. 608-609
ANALYSIS OF RESIDUAL-STRESS IN CUBIC BORON-NITRIDE THIN-FILMS USING MICROMACHINED CANTILEVER BEAMS
Authors: CARDINALE GF HOWITT DG MCCARTY KF MEDLIN DL MIRKARIMI PB MOODY NR
Citation: Gf. Cardinale et al., ANALYSIS OF RESIDUAL-STRESS IN CUBIC BORON-NITRIDE THIN-FILMS USING MICROMACHINED CANTILEVER BEAMS, DIAMOND AND RELATED MATERIALS, 5(11), 1996, pp. 1295-1302
ON THE GALERKIN VECTOR AND THE ESHELBY SOLUTION IN LINEAR ELASTICITY
Authors: CHEN SJ HOWITT DG
Citation: Sj. Chen et Dg. Howitt, ON THE GALERKIN VECTOR AND THE ESHELBY SOLUTION IN LINEAR ELASTICITY, Journal of elasticity, 44(1), 1996, pp. 1-8
MICROMACHINED SILICON CANTILEVER BEAMS FOR THIN-FILM STRESS MEASUREMENT
Authors: CARDINALE GF HOWITT DG CLIFT WM MCCARTY KF MEDLIN DL MIRKARIMI PB MOODY NR
Citation: Gf. Cardinale et al., MICROMACHINED SILICON CANTILEVER BEAMS FOR THIN-FILM STRESS MEASUREMENT, Thin solid films, 287(1-2), 1996, pp. 214-219
DIRECT MEASUREMENTS OF THE RADIOLYTIC TRANSFORMATION OF THIN-FILMS OFTITANIUM-DIOXIDE USING EELS
Authors: REZ P WEISS JK MEDLIN DL HOWITT DG
Citation: P. Rez et al., DIRECT MEASUREMENTS OF THE RADIOLYTIC TRANSFORMATION OF THIN-FILMS OFTITANIUM-DIOXIDE USING EELS, Microscopy microanalysis microstructures, 6(4), 1995, pp. 433-440
MONTE-CARLO CALCULATIONS FOR SPECIMENS WITH MICROSTRUCTURES
Authors: LY TD HOWITT DG FARRENS MK HARKER AB
Citation: Td. Ly et al., MONTE-CARLO CALCULATIONS FOR SPECIMENS WITH MICROSTRUCTURES, Scanning, 17(4), 1995, pp. 220-226
THE ANALYSIS OF CHLORINE SIGNAL DECAY IN ELECTRON-IRRADIATED SODIUM-CHLORIDE
Authors: MEDLIN DL HOWITT DG
Citation: Dl. Medlin et Dg. Howitt, THE ANALYSIS OF CHLORINE SIGNAL DECAY IN ELECTRON-IRRADIATED SODIUM-CHLORIDE, Radiation effects and defects in solids, 128(3), 1994, pp. 221-227
ON THE ROLE OF IONS IN THE FORMATION OF CUBIC BORON-NITRIDE FILMS BY ION-ASSISTED DEPOSITION
Authors: MIRKARIMI PB MCCARTY KF MEDLIN DL WOLFER WG FRIEDMANN TA KLAUS EJ CARDINALE GF HOWITT DG
Citation: Pb. Mirkarimi et al., ON THE ROLE OF IONS IN THE FORMATION OF CUBIC BORON-NITRIDE FILMS BY ION-ASSISTED DEPOSITION, Journal of materials research, 9(11), 1994, pp. 2925-2938
CHARGE-SENSITIVE SECONDARY-ELECTRON IMAGING OF DIAMOND MICROSTRUCTURES
Authors: HARKER AB HOWITT DG DENATALE JF FLINTOFF JF
Citation: Ab. Harker et al., CHARGE-SENSITIVE SECONDARY-ELECTRON IMAGING OF DIAMOND MICROSTRUCTURES, Scanning, 16(2), 1994, pp. 87-90
EFFECTS OF AMBIENT CONDITIONS ON THE ADHESION OF CUBIC BORON-NITRIDE FILMS ON SILICON SUBSTRATES
Authors: CARDINALE GF MIRKARIMI PB MCCARTY KF KLAUS EJ MEDLIN DL CLIFT WM HOWITT DG
Citation: Gf. Cardinale et al., EFFECTS OF AMBIENT CONDITIONS ON THE ADHESION OF CUBIC BORON-NITRIDE FILMS ON SILICON SUBSTRATES, Thin solid films, 253(1-2), 1994, pp. 130-135
THE DIFFICULTIES WITH LOW-LEVEL ASBESTOS EXPOSURE ASSESSMENTS IN PUBLIC, COMMERCIAL, AND INDUSTRIAL BUILDINGS
Authors: HOWITT DG HATFIELD J FISHLER G
Citation: Dg. Howitt et al., THE DIFFICULTIES WITH LOW-LEVEL ASBESTOS EXPOSURE ASSESSMENTS IN PUBLIC, COMMERCIAL, AND INDUSTRIAL BUILDINGS, American Industrial Hygiene Association journal, 54(5), 1993, pp. 267-271
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