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Results: 1-13 |
Results: 13
AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF ANGLE OF INCIDENCE EFFECTS OF ION-BEAM NITRIDATION OF GAAS
Authors: PAN JS HUAN CHA WEE ATS TAN HS TAN KL
Citation: Js. Pan et al., AUGER-ELECTRON SPECTROSCOPY AND X-RAY PHOTOELECTRON-SPECTROSCOPY ANALYSIS OF ANGLE OF INCIDENCE EFFECTS OF ION-BEAM NITRIDATION OF GAAS, Journal of materials research, 13(7), 1998, pp. 1799-1807
ATOMIC-FORCE MICROSCOPY INVESTIGATION OF THE O-2(-INDUCED SURFACE-TOPOGRAPHY OF INP())
Authors: PAN JS TAY ST HUAN CHA WEE ATS
Citation: Js. Pan et al., ATOMIC-FORCE MICROSCOPY INVESTIGATION OF THE O-2(-INDUCED SURFACE-TOPOGRAPHY OF INP()), Surface and interface analysis, 26(12), 1998, pp. 930-938
ON THE STRUCTURE AND COMPOSITION OF POLYCRYSTALLINE CARBON NITRIDE FILMS SYNTHESIZED BY REACTIVE RF MAGNETRON SPUTTERING
Authors: XU S LI HS LI YA LEE S HUAN CHA
Citation: S. Xu et al., ON THE STRUCTURE AND COMPOSITION OF POLYCRYSTALLINE CARBON NITRIDE FILMS SYNTHESIZED BY REACTIVE RF MAGNETRON SPUTTERING, Chemical physics letters, 287(5-6), 1998, pp. 731-736
IONIZATION PROBABILITY OF SI+ ION EMISSION FROM CLEAN SI UNDER AR+ BOMBARDMENT
Authors: LOW MHS HUAN CHA WEE ATS TAN KL
Citation: Mhs. Low et al., IONIZATION PROBABILITY OF SI+ ION EMISSION FROM CLEAN SI UNDER AR+ BOMBARDMENT, Journal of physics. Condensed matter, 9(43), 1997, pp. 9427-9433
AES ANALYSIS OF NITRIDATION OF SI(100) BY 2-10 KEV N-2(-BEAMS() ION)
Authors: PAN JS WEE ATS HUAN CHA TAN HS TAN KL
Citation: Js. Pan et al., AES ANALYSIS OF NITRIDATION OF SI(100) BY 2-10 KEV N-2(-BEAMS() ION), Applied surface science, 115(2), 1997, pp. 166-173
ARXPS ANALYSIS OF SURFACE COMPOSITIONAL CHANGE IN AR-BOMBARDED GAAS(100)( ION)
Authors: PAN JS WEE ATS HUAN CHA TAN HS TAN KL
Citation: Js. Pan et al., ARXPS ANALYSIS OF SURFACE COMPOSITIONAL CHANGE IN AR-BOMBARDED GAAS(100)( ION), Journal of physics. D, Applied physics, 30(18), 1997, pp. 2514-2519
AES ANALYSIS OF SILICON-NITRIDE FORMATION BY 10-KEV N-2(+) ION-IMPLANTATION( AND N)
Authors: PAN JS WEE ATS HUAN CHA TAN HS TAN KL
Citation: Js. Pan et al., AES ANALYSIS OF SILICON-NITRIDE FORMATION BY 10-KEV N-2(+) ION-IMPLANTATION( AND N), Vacuum, 47(12), 1996, pp. 1495-1499
XPS STUDIES ON NITRIDATION OF INP(100) SURFACE BY N-2(-BEAM BOMBARDMENT() ION)
Authors: PAN JS WEE ATS HUAN CHA TAN HS TAN KL
Citation: Js. Pan et al., XPS STUDIES ON NITRIDATION OF INP(100) SURFACE BY N-2(-BEAM BOMBARDMENT() ION), Journal of physics. D, Applied physics, 29(12), 1996, pp. 2997-3002
ARGON INCORPORATION AND SURFACE COMPOSITIONAL CHANGES IN INP(100) DUETO LOW-ENERGY AR-BOMBARDMENT( ION)
Authors: PAN JS WEE ATS HUAN CHA TAN HS TAN KL
Citation: Js. Pan et al., ARGON INCORPORATION AND SURFACE COMPOSITIONAL CHANGES IN INP(100) DUETO LOW-ENERGY AR-BOMBARDMENT( ION), Journal of applied physics, 80(12), 1996, pp. 6655-6660
ARGON INCORPORATION AND SILICON-CARBIDE FORMATION DURING LOW-ENERGY ARGON-ION BOMBARDMENT OF SI(100)
Authors: PAN JS WEE ATS HUAN CHA TAN HS
Citation: Js. Pan et al., ARGON INCORPORATION AND SILICON-CARBIDE FORMATION DURING LOW-ENERGY ARGON-ION BOMBARDMENT OF SI(100), Journal of applied physics, 79(6), 1996, pp. 2934-2941
AN ALTERNATIVE METHOD FOR DETERMINING THE TRANSMISSION FUNCTION OF SECONDARY-ION MASS SPECTROMETERS
Authors: LOW MHS HUAN CHA WEE ATS TAN KL
Citation: Mhs. Low et al., AN ALTERNATIVE METHOD FOR DETERMINING THE TRANSMISSION FUNCTION OF SECONDARY-ION MASS SPECTROMETERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 103(4), 1995, pp. 482-488
AN INVESTIGATION OF THE AR-ENHANCED REACTION OF CCL4 ON SI(100) BY SECONDARY-ION MASS-SPECTROSCOPY( ION)
Authors: WEE ATS HUAN CHA TAN KL TAN RSK
Citation: Ats. Wee et al., AN INVESTIGATION OF THE AR-ENHANCED REACTION OF CCL4 ON SI(100) BY SECONDARY-ION MASS-SPECTROSCOPY( ION), Journal of Materials Science, 29(15), 1994, pp. 4037-4042
A COMPARATIVE-STUDY OF THE INITIAL OXYGEN AND WATER REACTIONS ON GERMANIUM AND SILICON USING SIMS
Authors: WEE ATS HUAN CHA THONG PSP TAN KL
Citation: Ats. Wee et al., A COMPARATIVE-STUDY OF THE INITIAL OXYGEN AND WATER REACTIONS ON GERMANIUM AND SILICON USING SIMS, Corrosion science, 36(1), 1994, pp. 9-22
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