Authors:
Gaganidze, E
Schwab, R
Halbritter, J
Heidinger, R
Aidam, R
Schneider, R
Citation: E. Gaganidze et al., Power handling capabilities of Y-Ba-Cu-O wafers and patterned microstrip resonators, IEEE APPL S, 11(1), 2001, pp. 2808-2811
Authors:
Halbritter, J
Kneisel, P
Palmieri, V
Pekeler, M
Citation: J. Halbritter et al., Electric surface resistance R-E(T, f, E-perpendicular to) of Nb/Nb2O5-y-interfaces and Q-drop of superconducting Nb cavities, IEEE APPL S, 11(1), 2001, pp. 1864-1868
Authors:
Schwab, R
Gaganidze, E
Halbritter, J
Heidinger, R
Aidam, R
Schneider, R
Citation: R. Schwab et al., YBCO wafer qualification by surface resistance measurements combined with performance studies of microstrip resonators, PHYSICA C, 351(1), 2001, pp. 25-28
Citation: J. Halbritter, Materials science and surface impedance Z (T, f, H) of Nb and YBCO and their quantitative modelling by the leakage current of weak links, SUPERCOND S, 12(11), 1999, pp. 883-886
Citation: J. Halbritter, Comment on "Direct observation of the superconducting energy gap developing in the conductivity spectra of niobium", PHYS REV B, 60(17), 1999, pp. 12505-12506
Citation: J. Halbritter, Charge dynamics via the blocking layer and the pseudo gap of high T-c-superconductors (HTS), STUD HIGH T, 27, 1999, pp. 189-200