AAAAAA

   
Results: 1-8 |
Results: 8
Atomic dynamics in single and multi-photon double ionization: An experimental comparison
Authors: Weber, T Weckenbrock, M Staudte, A Hattass, M Spielberger, L Jagutzki, O Mergel, V Bocking, HS Urbasch, G Giessen, H Brauning, H Cocke, CL Prior, MH Dorner, R
Citation: T. Weber et al., Atomic dynamics in single and multi-photon double ionization: An experimental comparison, OPT EXPRESS, 8(7), 2001, pp. 368-376
K-shell photoionization of CO and N-2: is there a link between the photoelectron angular distribution and the molecular decay dynamics?
Authors: Weber, T Jagutzki, O Hattass, M Staudte, A Nauert, A Schmidt, L Prior, MH Landers, AL Brauning-Demian, A Brauning, H Cocke, CL Osipov, T Ali, I Muino, RD Rolles, D de Abajo, FJG Fadley, CS Van Hove, MA Cassimi, A Schmidt-Bocking, H Dorner, R
Citation: T. Weber et al., K-shell photoionization of CO and N-2: is there a link between the photoelectron angular distribution and the molecular decay dynamics?, J PHYS B, 34(18), 2001, pp. 3669-3678
Experimental evidence for electron repulsion in multiphoton double ionization
Authors: Weckenbrock, M Hattass, M Czasch, A Jagutzki, O Schmidt, L Weber, T Roskos, H Loffler, T Thomson, M Dorner, R
Citation: M. Weckenbrock et al., Experimental evidence for electron repulsion in multiphoton double ionization, J PHYS B, 34(14), 2001, pp. L449-L455
Photoelectron diffraction mapping: Molecules illuminated from within - art. no. 013002
Authors: Landers, A Weber, T Ali, I Cassimi, A Hattass, M Jagutzki, O Nauert, A Osipov, T Staudte, A Prior, MH Schmidt-Bocking, H Cocke, CL Dorner, R
Citation: A. Landers et al., Photoelectron diffraction mapping: Molecules illuminated from within - art. no. 013002, PHYS REV L, 8701(1), 2001, pp. 3002-NIL_47
Surface analysis by highly charged ion based secondary ion mass spectrometry
Authors: Schenkel, T Hamza, AV Barnes, AV Newman, MW Machicoane, G Niedermayer, T Hattass, M McDonald, JW Schneider, DH Wu, KJ Odom, RW
Citation: T. Schenkel et al., Surface analysis by highly charged ion based secondary ion mass spectrometry, PHYS SCR, T80A, 1999, pp. 73-75
Deposition of potential energy in solids by slow, highly charged ions
Authors: Schenkel, T Barnes, AV Niedermayr, TR Hattass, M Newman, MW Machicoane, GA McDonald, JW Hamza, AV Schneider, DH
Citation: T. Schenkel et al., Deposition of potential energy in solids by slow, highly charged ions, PHYS REV L, 83(21), 1999, pp. 4273-4276
Charge equilibration time of slow, highly charged ions in solids
Authors: Hattass, M Schenkel, T Hamza, AV Barnes, AV Newman, MW McDonald, JW Niedermayr, TR Machicoane, GA Schneider, DH
Citation: M. Hattass et al., Charge equilibration time of slow, highly charged ions in solids, PHYS REV L, 82(24), 1999, pp. 4795-4798
Electronic desorption of alkyl monolayers from silicon by very highly charged ions
Authors: Schenkel, T Schneider, M Hattass, M Newman, MW Barnes, AV Hamza, AV Schneider, DH Cicero, RL Chidsey, CED
Citation: T. Schenkel et al., Electronic desorption of alkyl monolayers from silicon by very highly charged ions, J VAC SCI B, 16(6), 1998, pp. 3298-3300
Risultati: 1-8 |