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Results: 1-18 |
Results: 18

Authors: Rizza, GC Strobel, M Heinig, KH Bernas, H
Citation: Gc. Rizza et al., Ion irradiation of gold inclusions in SiO2: Experimental evidence for inverse Ostwald ripening, NUCL INST B, 178, 2001, pp. 78-83

Authors: Strobel, M Heinig, KH Michely, T
Citation: M. Strobel et al., Three-dimensional kinetic lattice Monte-Carlo simulation of ion erosion offcc(111) surfaces, NUCL INST B, 178, 2001, pp. 105-108

Authors: Muller, T Heinig, KH Schmidt, B
Citation: T. Muller et al., Shape evolution of oxidized silicon V-grooves during high dose ion implantation, NUCL INST B, 178, 2001, pp. 109-114

Authors: Borodin, VA Heinig, KH Schmidt, B Oswald, S
Citation: Va. Borodin et al., Oxidation of Ge implanted into SiO2 layers: Modeling and XPS, NUCL INST B, 178, 2001, pp. 115-119

Authors: Bernas, H Heinig, KH Williams, J Lindner, JKN
Citation: H. Bernas et al., Proceedings of the E-MRS 2000 Spring Meeting Symposium R on Materials Science with Ion Beams Strasbourg, France, 30 May-2 June 2000, NUCL INST B, 178, 2001, pp. VII-VII

Authors: Muller, T Heinig, KH Schmidt, B
Citation: T. Muller et al., Formation of Ge nanowires in oxidized silicon V-grooves by ion beam synthesis, NUCL INST B, 175, 2001, pp. 468-473

Authors: Strobel, M Heinig, KH Michely, T
Citation: M. Strobel et al., Mechanisms of pit coarsening in ion erosion of fcc(111) surfaces: a kinetic 3D lattice Monte-Carlo study, SURF SCI, 486(1-2), 2001, pp. 136-156

Authors: Michely, T Kalff, M Comsa, G Strobel, M Heinig, KH
Citation: T. Michely et al., Step edge diffusion and step atom detachment in surface evolution: Ion-erosion of Pt(111), PHYS REV L, 86(12), 2001, pp. 2589-2592

Authors: Koch, T Heinig, KH Jentschel, M Borner, HG
Citation: T. Koch et al., Study of interatomic potentials in ZnS - Crystal-GRID experiments versus ab initio calculations, J RES NAT I, 105(1), 2000, pp. 81-87

Authors: Oswald, S Schmidt, B Heinig, KH
Citation: S. Oswald et al., XPS investigation with factor analysis for the study of Ge clustering in SiO2, SURF INT AN, 29(4), 2000, pp. 249-254

Authors: Thees, HJ Wittmaack, M Stegemann, KH von Borany, J Heinig, KH Gebel, T
Citation: Hj. Thees et al., Microstructure and electrical properties of gale SiO2 containing Ge nanoclusters for memory applications, MICROEL REL, 40(4-5), 2000, pp. 867-871

Authors: Markwitz, A Grotzschel, R Heinig, KH Rebohle, L Skorupa, W
Citation: A. Markwitz et al., Microstructural investigation of Sn nanoclusters in double-energy implanted and annealed SiO2 layers with cross-sectional TEM, NUCL INST B, 152(2-3), 1999, pp. 319-324

Authors: Strobel, M Heinig, KH Moller, W
Citation: M. Strobel et al., Can core/shell nanocrystals be formed by sequential ion implantation? Predictions from kinetic lattice Monte Carlo simulations, NUCL INST B, 148(1-4), 1999, pp. 104-109

Authors: Heinig, KH Schmidt, B Markwitz, A Grotzschel, R Strobel, M Oswald, S
Citation: Kh. Heinig et al., Precipitation, ripening and chemical effects during annealing of Ge+ implanted SiO2 layers, NUCL INST B, 148(1-4), 1999, pp. 969-974

Authors: Borodin, VA Heinig, KH Schmidt, B
Citation: Va. Borodin et al., Modeling of Ge nanocluster evolution in ion-implanted SiO2 layer, NUCL INST B, 147(1-4), 1999, pp. 286-291

Authors: Strobel, M Heinig, KH Moller, W Meldrum, A Zhou, DS White, CW Zuhr, RA
Citation: M. Strobel et al., Ion beam synthesis of gold nanoclusters in SiO2: Computer simulations versus experiments, NUCL INST B, 147(1-4), 1999, pp. 343-349

Authors: von Borany, J Heinig, KH Grotzschel, R Klimenkov, M Strobel, M Stegemann, KH Thees, HJ
Citation: J. Von Borany et al., Ion beam synthesis of narrow Ge nanocluster bands in thin SiO2 films, MICROEL ENG, 48(1-4), 1999, pp. 231-234

Authors: von Borany, J Grotzschel, R Heinig, KH Markwitz, A Schmidt, B Skorupa, W Thees, HJ
Citation: J. Von Borany et al., The formation of narrow nanocluster bands in Ge-implanted SiO2-layers, SOL ST ELEC, 43(6), 1999, pp. 1159-1163
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