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Results: 1-8 |
Results: 8
High mobility thin film transistors by Nd : YVO4-laser crystallization
Authors: Helen, Y Dassow, R Nerding, M Mourgues, K Raoult, F Kohler, JR Mohammed-Brahim, T Rogel, R Bonnaud, O Werner, JH Strunk, HP
Citation: Y. Helen et al., High mobility thin film transistors by Nd : YVO4-laser crystallization, THIN SOL FI, 383(1-2), 2001, pp. 143-146
Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material
Authors: Toutah, H Tala-Ighil, B Llibre, JF Rahal, A Mourgues, K Helen, Y Brahim, TM Dassow, R Kohler, JR
Citation: H. Toutah et al., Stability of unhydrogenated polysilicon thin film transistors and structural quality of the channel material, THIN SOL FI, 383(1-2), 2001, pp. 299-302
Improved stability of large area excimer laser crystallised polysilicon thin film transistors under DC and AC operating
Authors: Toutah, H Llibre, JF Tala-Ighil, B Mohammed-Brahim, T Helen, Y Gautier, G Bonnaud, O
Citation: H. Toutah et al., Improved stability of large area excimer laser crystallised polysilicon thin film transistors under DC and AC operating, MICROEL REL, 41(9-10), 2001, pp. 1325-1329
Laser crystallization of silicon for high-performance thin-film transistors
Authors: Dassow, R Kohler, JR Helen, Y Mourgues, K Bonnaud, O Mohammed-Brahim, T Werner, JH
Citation: R. Dassow et al., Laser crystallization of silicon for high-performance thin-film transistors, SEMIC SCI T, 15(10), 2000, pp. L31-L34
Stability of polysilicon thin film transistors under switch operating
Authors: Toutah, H Llibre, JF Tala-Ighil, B Mohammed-Brahim, T Mourgues, K Helen, Y Raoult, F Bonnaud, O
Citation: H. Toutah et al., Stability of polysilicon thin film transistors under switch operating, MICROEL REL, 40(8-10), 2000, pp. 1573-1577
Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors
Authors: Pichon, L Mercha, A Carin, R Bonnaud, O Mohammed-Brahim, T Helen, Y Rogel, R
Citation: L. Pichon et al., Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors, APPL PHYS L, 77(4), 2000, pp. 576-578
Single shot excimer laser crystallization and LPCVD silicon TFTs
Authors: Helen, Y Mourgues, K Raoult, F Mohammed-Brahim, T Bonnaud, O Rogel, R Prochasson, S Boher, P Zahorski, D
Citation: Y. Helen et al., Single shot excimer laser crystallization and LPCVD silicon TFTs, THIN SOL FI, 337(1-2), 1999, pp. 133-136
Ageing of laser crystallized and unhydrogenated polysilicon thin film transistors
Authors: Rahal, A Mohammed-Brahim, T Toutah, H Tala-Ighil, B Helen, Y Prat, C Raoult, F
Citation: A. Rahal et al., Ageing of laser crystallized and unhydrogenated polysilicon thin film transistors, MICROEL REL, 39(6-7), 1999, pp. 851-855
Risultati: 1-8 |