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Results: 1-13 |
Results: 13
Electronic structure at carbon nanotube tips studied by photoemission spectroscopy - art. no. 245418
Authors: Suzuki, S Watanabe, Y Kiyokura, T Nath, KG Ogino, T Heun, S Zhu, W Bower, C Zhou, O
Citation: S. Suzuki et al., Electronic structure at carbon nanotube tips studied by photoemission spectroscopy - art. no. 245418, PHYS REV B, 6324(24), 2001, pp. 5418
Core-level photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001) - art. no. 125335
Authors: Heun, S Watanabe, Y Ressel, B Bottomley, D Schmidt, T Prince, KC
Citation: S. Heun et al., Core-level photoelectron spectroscopy from individual heteroepitaxial nanocrystals on GaAs(001) - art. no. 125335, PHYS REV B, 6312(12), 2001, pp. 5335
Local Au coverage as driving force for Au induced faceting of vicinal Si(001): a LEEM and XPEEM study
Authors: Heringdorf, FJMZ Hild, R Zahl, P Schmidt, T Ressel, B Heun, S Bauer, E Horn-von Hoegen, M
Citation: Fjmz. Heringdorf et al., Local Au coverage as driving force for Au induced faceting of vicinal Si(001): a LEEM and XPEEM study, SURF SCI, 480(3), 2001, pp. 103-108
Spatial variation of Au coverage as the driving force for nanoscopic pattern formation
Authors: Heringdorf, FJMZ Schmidt, T Heun, S Hild, R Zahl, P Ressel, B Bauer, E Horn-von Hoegen, M
Citation: Fjmz. Heringdorf et al., Spatial variation of Au coverage as the driving force for nanoscopic pattern formation, PHYS REV L, 86(22), 2001, pp. 5088-5091
Transmission electron microscopy studies of the microstructure of Si layers grown on GaAs(001) under an excess As or Al flux
Authors: Carlino, E Sorba, L Franciosi, A Heun, S Muller, BH
Citation: E. Carlino et al., Transmission electron microscopy studies of the microstructure of Si layers grown on GaAs(001) under an excess As or Al flux, PHIL MAG B, 80(5), 2000, pp. 1055-1069
XPEEM study of liquid Au-Si droplets on Si(111) near to the eutectic point
Authors: Ressel, B Heun, S Schmidt, T Prince, KC
Citation: B. Ressel et al., XPEEM study of liquid Au-Si droplets on Si(111) near to the eutectic point, DEFECT DIFF, 183-1, 2000, pp. 181-187
Surface diffusion of Au on Si(111): A microscopic study
Authors: Slezak, J Ondrejcek, M Chvoj, Z Chab, V Conrad, H Heun, S Schmidt, T Ressel, B Prince, KC
Citation: J. Slezak et al., Surface diffusion of Au on Si(111): A microscopic study, PHYS REV B, 61(23), 2000, pp. 16121-16128
Preliminary spectromicroscopic measurements of self-organized InAs nanocrystals by SPELEEM
Authors: Watanabe, Y Heun, S Schmidt, T Prince, KC
Citation: Y. Watanabe et al., Preliminary spectromicroscopic measurements of self-organized InAs nanocrystals by SPELEEM, JPN J A P 1, 38, 1999, pp. 556-559
Hole transport in doubly-doped polystyrene
Authors: Heun, S Borsenberger, PM
Citation: S. Heun et Pm. Borsenberger, Hole transport in doubly-doped polystyrene, J IMAG SC T, 43(3), 1999, pp. 206-212
Optical layout of a beamline for photoemission microscopy
Authors: Schmidt, T Slezak, J Heun, S Diaz, J Blyth, RR Delaunay, R Cocco, D Prince, KC Bauer, E Coreno, M
Citation: T. Schmidt et al., Optical layout of a beamline for photoemission microscopy, J SYNCHROTR, 6, 1999, pp. 957-963
Lateral inhomogeneities in engineered Schottky barriers
Authors: Heun, S Schmidt, T Slezak, J Diaz, J Prince, KC Muller, BH Franciosi, A
Citation: S. Heun et al., Lateral inhomogeneities in engineered Schottky barriers, J CRYST GR, 202, 1999, pp. 795-799
Zn0.85Cd0.15Se active layers on graded-composition InxGa1-xAs buffer layers
Authors: Muller, BH Lantier, R Sorba, L Heun, S Rubini, S Lazzarino, M Franciosi, A Napolitani, E Romanato, F Drigo, AV Lazzarini, L Salviati, G
Citation: Bh. Muller et al., Zn0.85Cd0.15Se active layers on graded-composition InxGa1-xAs buffer layers, J APPL PHYS, 85(12), 1999, pp. 8160-8169
SPELEEM: Combining LEEM and spectroscopic imaging
Authors: Schmidt, T Heun, S Slezak, J Diaz, J Prince, KC Lilienkamp, G Bauer, E
Citation: T. Schmidt et al., SPELEEM: Combining LEEM and spectroscopic imaging, SURF REV L, 5(6), 1998, pp. 1287-1296
Risultati: 1-13 |