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Results:
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Results: 13
Authors:
Seifert, A
Ledermann, N
Hiboux, S
Baborowski, J
Muralt, P
Setter, N
Citation: A. Seifert et al., Processing optimization of solution derived PbZr1-xTixO3 thin films for piezoelectric applications, INTEGR FERR, 35(1-4), 2001, pp. 1889-1896
Authors:
Ledermann, N
Baborowski, J
Seifert, A
Willing, B
Hiboux, S
Muralt, P
Setter, N
Forster, M
Citation: N. Ledermann et al., Piezoelectric cantilever microphone for photoacoustic GAS detector, INTEGR FERR, 35(1-4), 2001, pp. 1907-1914
Authors:
Haccart, T
Cattan, E
Remiens, D
Hiboux, S
Muralt, P
Citation: T. Haccart et al., Ferroelectric and piezoelectric properties of Nb doped PZT films, INTEGR FERR, 35(1-4), 2001, pp. 1969-1978
Authors:
Malic, B
Kosec, M
Arcon, I
Kodre, A
Hiboux, S
Muralt, P
Citation: B. Malic et al., PZT thin films prepared from modified zirconium alkoxide, INTEGR FERR, 30(1-4), 2000, pp. 81-89
Authors:
Baborowski, J
Muralt, P
Ledermann, N
Hiboux, S
Citation: J. Baborowski et al., Etching of RuO2 and Pt thin films with ECR/RF reactor, VACUUM, 56(1), 2000, pp. 51-56
Authors:
Stolichnov, I
Tagantsev, A
Colla, E
Gentil, S
Hiboux, S
Baborowski, J
Muralt, P
Setter, N
Citation: I. Stolichnov et al., Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces, J APPL PHYS, 88(4), 2000, pp. 2154-2156
Authors:
Haccart, T
Cattan, E
Remiens, D
Hiboux, S
Muralt, P
Citation: T. Haccart et al., Evaluation of niobium effects on the longitudinal piezoelectric coefficients of Pb(Zr, Ti)O-3 thin films, APPL PHYS L, 76(22), 2000, pp. 3292-3294
Authors:
Kighelman, Z
Damjanovic, D
Seifert, A
Hiboux, S
Sagalowicz, L
Setter, N
Citation: Z. Kighelman et al., Relaxor Pb(Mg1/3Nb2/3)O-3 thin films and their electromechanical properties, INTEGR FERR, 25(1-4), 1999, pp. 465-473
Authors:
Ledermann, N
Seifert, A
Hiboux, S
Muralt, P
Citation: N. Ledermann et al., Effective transverse piezoelectric coefficient e(31,f) of (100)/(001) textured PZT thin films, INTEGR FERR, 24(1-4), 1999, pp. 13-18
Authors:
Hiboux, S
Muralt, P
Maeder, T
Citation: S. Hiboux et al., Domain and lattice contributions to dielectric and piezoelectric properties of Pb(Zr-x,Ti1-x)O-3 thin films as a function of composition, J MATER RES, 14(11), 1999, pp. 4307-4318
Authors:
Masumoto, H
Hiboux, S
Muralt, P
Citation: H. Masumoto et al., Preparation of La1-xSrxCoO3 electrodes for ferroelectric thin films by RF magnetron sputtering, FERROELECTR, 225(1-4), 1999, pp. 1141-1147
Authors:
Muralt, P
Dubois, MA
Seifert, A
Taylor, DV
Ledermann, N
Hiboux, S
Citation: P. Muralt et al., In-plane piezoelectric coefficient of PZT thin films as a function of composition, FERROELECTR, 224(1-4), 1999, pp. 663-670
Authors:
Hiboux, S
Muralt, P
Citation: S. Hiboux et P. Muralt, Piezoelectric and dielectric properties of sputter deposited (111), (100) and random-textured Pb(ZrxTi1-x)O-3 (PZT) thin films, FERROELECTR, 224(1-4), 1999, pp. 743-750
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