Authors:
Eisenmenger, J
Schiessling, J
Bolz, U
Runge, BU
Leiderer, P
Lorenz, M
Hochmuth, H
Wallenhorst, M
Dotsch, H
Citation: J. Eisenmenger et al., Nondestructive magneto-optical characterization of natural and artificial defects on 3 '' HTSC wafers at liquid nitrogen temperature, IEEE APPL S, 9(2), 1999, pp. 1840-1843
Authors:
Lorenz, M
Hochmuth, H
Natusch, D
Lippold, G
Svetchnikov, VL
Kaiser, T
Hein, MA
Schwab, R
Heidinger, R
Citation: M. Lorenz et al., Ag-doped double-sided PLD-YBCO thin films for passive microwave devices infuture communication systems, IEEE APPL S, 9(2), 1999, pp. 1936-1939
Authors:
Kastner, G
Schafer, C
Senz, S
Kaiser, T
Hein, MA
Lorenz, M
Hochmuth, H
Hesse, D
Citation: G. Kastner et al., Microstructure and microwave surface resistance of typical YBaCuO thin films on sapphire and LaAlO3, SUPERCOND S, 12(6), 1999, pp. 366-375
Authors:
Lorenz, M
Hochmuth, H
Natusch, D
Kreher, K
Citation: M. Lorenz et al., Highly reproducible large-area and double-sided pulsed laser deposition ofHTSC YBCO : Ag thin films for microwave applications, APPL PHYS A, 69, 1999, pp. S905-S911