Authors:
Hock, G
Kohn, E
Rosenblad, C
von Kanel, H
Herzog, HJ
Konig, U
Citation: G. Hock et al., High hole mobility in Si0.17Ge0.83 channel metal-oxide-semiconductor field-effect transistors grown by plasma-enhanced chemical vapor deposition, APPL PHYS L, 76(26), 2000, pp. 3920-3922
Authors:
Feinberg, BA
Petro, L
Hock, G
Qin, WY
Margoliash, E
Citation: Ba. Feinberg et al., Using entropies of reaction to predict changes in protein stability: tyrosine-67-phenylalanine variants of rat cytochrome c and yeast Iso-1 cytochromes c, J PHARM B, 19(1-2), 1999, pp. 115-125
Citation: K. Tokesi et G. Hock, Examination of initial and final state interactions in p plus H collisionsby the CTMC method, NUCL INST B, 154(1-4), 1999, pp. 263-266
Citation: L. Sarkadi et G. Hock, Fast ion-atom collisions - Proceedings of the Seventh Workshop on Fast Ion-Atom Collisions Debrecen, Hungary, 9-11 September 1998, NUCL INST B, 154(1-4), 1999, pp. VII-VII
Authors:
Hock, G
Gluck, M
Hackbarth, T
Herzog, HJ
Kohn, E
Citation: G. Hock et al., Carrier mobilities in modulation doped Si1-xGex heterostructures with respect to FET applications, THIN SOL FI, 336(1-2), 1998, pp. 141-144