Authors:
Holiney, RY
Matveeva, LA
Venger, EF
Litvinenko, OA
Karachevtseva, LA
Citation: Ry. Holiney et al., Electroreflectance study of macroporous silicon surfaces (vol 172, pg 214,2001), APPL SURF S, 180(1-2), 2001, pp. 184-184
Authors:
Gorbach, TY
Holiney, RY
Matveeva, LA
Svechnikov, SV
Venger, EF
Kuzma, M
Wisz, G
Citation: Ty. Gorbach et al., Effect of the Si wafer pretreatment on the patterned substrate morphology and growth of Hg1-xCdxTePLD films, MAT SCI E B, 71, 2000, pp. 288-291
Authors:
Holiney, RY
Fedorenko, LL
Matveeva, LA
Strilchenko, IY
Venger, EF
Yusupov, NM
Citation: Ry. Holiney et al., Electroreflectance of porous layers obtained by stain etching of laser modified silicon, J PHYS D, 33(22), 2000, pp. 2875-2879