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Results:
1-9
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Results: 9
Authors:
Hsiao, MS
Rudnick, EM
Patel, JH
Citation: Ms. Hsiao et al., Dynamic state traversal for sequential circuit test generation, ACM T DES A, 5(3), 2000, pp. 548-565
Authors:
Hsiao, MS
Rudnick, EM
Patel, JH
Citation: Ms. Hsiao et al., Peak power estimation of VLSI circuits: New peak power measures, IEEE VLSI, 8(4), 2000, pp. 435-439
Authors:
Hsiao, MS
Chakradhar, S
Citation: Ms. Hsiao et S. Chakradhar, Test set compaction using relaxed subsequence removal, J ELEC TEST, 16(4), 2000, pp. 319-327
Authors:
Hsiao, MS
Chakradhar, S
Citation: Ms. Hsiao et S. Chakradhar, Test set and fault partitioning techniques for static test sequence compaction for sequential circuits, J ELEC TEST, 16(4), 2000, pp. 329-338
Authors:
Seshadri, S
Hsiao, MS
Citation: S. Seshadri et Ms. Hsiao, Formal value-range and variable testability techniques for high-level design-for-testability, J ELEC TEST, 16(1-2), 2000, pp. 131-145
Authors:
Hsiao, MS
Chen, HL
Liaw, DJ
Citation: Ms. Hsiao et al., A mesomorphic blend based on the solid-state complexes of polymers with surfactants, MACROMOLEC, 33(1), 2000, pp. 221-224
Authors:
Hsiao, MS
Citation: Ms. Hsiao, On non-statistical techniques for fast fault coverage estimation, J ELEC TEST, 15(3), 1999, pp. 239-254
Authors:
Chen, HL
Hsiao, MS
Citation: Hl. Chen et Ms. Hsiao, Self-assembled mesomorphic complexes of branched poly(ethylenimine) and dodecylbenzenesulfonic acid, MACROMOLEC, 32(9), 1999, pp. 2967-2973
Authors:
Hsiao, MS
Rudnick, EM
Patel, JH
Citation: Ms. Hsiao et al., Fast static compaction algorithms for sequential circuit test vectors, IEEE COMPUT, 48(3), 1999, pp. 311-322
Risultati:
1-9
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