Authors: Nah, W Hwangbo, H Kim, BS Lee, JH Kim, JH Joo, J Ha, HS Sohn, MH

Citation: W. Nah et al., Critical current degradation in jointed area of Ag-sheathed BSCCO tapes, IEEE APPL S, 11(1), 2001, pp. 3014-3017

Authors: Kang, H Kim, JH Hwangbo, H Joo, J Nah, W Jang, M Kim, HM Yoon, YS Oh, SS Ryu, KS Ko, TK

Citation: H. Kang et al., The experimental study of AC loss dependency on joint method in BSCCO-2223tape, IEEE APPL S, 11(1), 2001, pp. 2216-2219

Authors: Nah, W Hwangbo, H Ye, J Joo, J Jang, HM Ha, HS Oh, SS Kwon, YK Sohn, MH Ryu, KS

Citation: W. Nah et al., Load line analysis of Bi-2223 tape-stacked-cable for self field effects, IEEE APPL S, 10(1), 2000, pp. 1158-1161

Authors: Bang, H Park, Y Han, J Hwangbo, H

Citation: H. Bang et al., Feedback control for slew maneuver using on-off thrusters, J GUID CON, 22(6), 1999, pp. 816-822