Authors: RYEN L OLSSON E MADSEN LD WANG X EDVARDSSON CNL JACOBSEN SN HELMERSSON U RUDNER S WERNLUND LD

Citation: L. Ryen et al., MICROSTRUCTURE AND MICROWAVE DIELECTRIC-PROPERTIES OF EPITAXIAL SRTIO3 FILMS ON LAALO3 SUBSTRATES, Journal of applied physics, 83(9), 1998, pp. 4884-4890

Authors: MADSEN LD WEAVER L JACOBSEN SN

Citation: Ld. Madsen et al., INFLUENCE OF MATERIAL PROPERTIES ON TEM SPECIMEN PREPARATION OF THIN-FILMS, Microscopy research and technique, 36(5), 1997, pp. 354-361

Authors: MADSEN LD JOHNSON CNL JACOBSEN SN HELMERSSON U RUDNER S IVANOV I WERNLUND LD RYEN L OLSSON E

Citation: Ld. Madsen et al., STRUCTURAL AND ELECTRICAL CHARACTERIZATION OF SPUTTER-DEPOSITED SRTIO3 THIN-FILMS, Microelectronic engineering, 29(1-4), 1995, pp. 123-127

Authors: RYEN L OLSSON E MADSEN LD JOHNSON CN WANG X JACOBSEN SN HELMERSSON U RUDNER S WERNLUND LD

Citation: L. Ryen et al., TRANSMISSION ELECTRON-MICROSCOPY OF EPITAXIAL SRTIO3 FILMS ON LAALO3 SUBSTRATES, Microelectronic engineering, 29(1-4), 1995, pp. 309-312

Authors: GUO S ARWIN H JACOBSEN SN JARRENDAHL K HELMERSSON U

Citation: S. Guo et al., SPECTROSCOPIC ELLIPSOMETRY STUDY OF CERIUM DIOXIDE THIN-FILMS GROWN ON SAPPHIRE BY RF MAGNETRON SPUTTERING, Journal of applied physics, 77(10), 1995, pp. 5369-5376