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Citation: C. Manfredotti et al., PROTON MICROBEAM INVESTIGATIONS ON ELECTRICAL-PROPERTIES OF NATURAL AND CVD DIAMOND, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 491-497
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Citation: C. Manfredotti et al., STUDY OF PHYSICAL AND CHEMICAL INHOMOGENEITIES IN SEMICONDUCTING AND INSULATING MATERIALS BY A COMBINED USE OF MICRO-PIXE AND MICRO-IBIC, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 555-562
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Citation: T. Tadic et al., APPLICATION OF MEV CARBON-IONS FOR PIXE MEASUREMENTS IN SILICON AND HIGH-T-C SUPERCONDUCTORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 109, 1996, pp. 580-583
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