Authors:
LARSON L
JELLOIAN L
ROSENBAUM S
SCHMITZ A
THOMPSON M
LUI M
NGUYEN L
MISHRA U
Citation: L. Larson et al., MANUFACTURING STUDY OF YIELD AND PERFORMANCE DEPENDENCE ON GATE LENGTH FOR SUBMICRON ALLNAS-GAINAS HEMTS, IEEE transactions on semiconductor manufacturing, 6(4), 1993, pp. 380-383