Authors: RANDALL NX HOLLANDER E JULIASCHMUTZ C

Citation: Nx. Randall et al., CHARACTERIZATION OF INTEGRATED-CIRCUIT ALUMINUM BONDING PADS BY NANOINDENTATION AND SCANNING FORCE MICROSCOPY, Surface & coatings technology, 99(1-2), 1998, pp. 111-117

Authors: RANDALL NX JULIASCHMUTZ C SORO JM

Citation: Nx. Randall et al., COMBINING SCANNING FORCE MICROSCOPY WITH NANOINDENTATION FOR MORE COMPLETE CHARACTERIZATION OF BULK AND COATED MATERIALS, Surface & coatings technology, 109(1-3), 1998, pp. 489-495

Authors: RANDALL NX JULIASCHMUTZ C SORO JM VONSTEBUT J ZACHARIE G

Citation: Nx. Randall et al., NOVEL NANOINDENTATION METHOD FOR CHARACTERIZING MULTIPHASE MATERIALS, Thin solid films, 308, 1997, pp. 297-303

Authors: RANDALL NX CHRISTOPH R DROZ S JULIASCHMUTZ C

Citation: Nx. Randall et al., LOCALIZED MICRO-HARDNESS MEASUREMENTS WITH A COMBINED SCANNING FORCE MICROSCOPE NANOINDENTATION SYSTEM/, Thin solid films, 291, 1996, pp. 348-354