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Results: 1-13 |
Results: 13
High precision comparison between SNS and SIS Josephson voltage standards
Authors: Jeanneret, B Rufenacht, A Burroughs, CJ
Citation: B. Jeanneret et al., High precision comparison between SNS and SIS Josephson voltage standards, IEEE INSTR, 50(2), 2001, pp. 188-191
Recent developments in BIPM voltage standard comparisons
Authors: Reymann, D Witt, TJ Vrabcek, P Tang, YH Hamilton, CA Katkov, AS Jeanneret, B Power, O
Citation: D. Reymann et al., Recent developments in BIPM voltage standard comparisons, IEEE INSTR, 50(2), 2001, pp. 206-209
Optimization of QHE-devices for metrological applications
Authors: Jeckelmann, B Rufenacht, A Jeanneret, B Overney, F Pierz, K von Campenhausen, A Hein, G
Citation: B. Jeckelmann et al., Optimization of QHE-devices for metrological applications, IEEE INSTR, 50(2), 2001, pp. 218-222
The OFMET Watt balance: Progress report
Authors: Beer, W Eichenberger, AL Jeanneret, B Jeckelmann, B Richard, P Schneiter, H Pourzand, AR Courteville, A Dandliker, R
Citation: W. Beer et al., The OFMET Watt balance: Progress report, IEEE INSTR, 50(2), 2001, pp. 583-586
Odontoid fractures: high complication rate associated with anterior screw fixation in the elderly - Reviewer's comment
Authors: Jeanneret, B
Citation: B. Jeanneret, Odontoid fractures: high complication rate associated with anterior screw fixation in the elderly - Reviewer's comment, EUR SPINE J, 9(1), 2000, pp. 60-60
Realistic and relevant models for the description of SET transistors
Authors: Furlan, M Eichenberger, AL Heinzel, T Jeanneret, B Lotkhov, SV
Citation: M. Furlan et al., Realistic and relevant models for the description of SET transistors, PHYSICA B, 284, 2000, pp. 1798-1799
Non-Gaussian distribution of nearest-neighbour Coulomb peak spacings in metallic single-electron transistors
Authors: Furlan, M Heinzel, T Jeanneret, B Lotkhov, SV Ensslin, K
Citation: M. Furlan et al., Non-Gaussian distribution of nearest-neighbour Coulomb peak spacings in metallic single-electron transistors, EUROPH LETT, 49(3), 2000, pp. 369-375
Coulomb blockade peak statistics influenced by background charge configuration
Authors: Furlan, M Heinzel, T Jeanneret, B Lotkhov, SV
Citation: M. Furlan et al., Coulomb blockade peak statistics influenced by background charge configuration, J L TEMP PH, 118(5-6), 2000, pp. 297-306
A tunable vacuum-gap cryogenic coaxial capacitor
Authors: Overney, F Jeanneret, B Furlan, M
Citation: F. Overney et al., A tunable vacuum-gap cryogenic coaxial capacitor, IEEE INSTR, 49(6), 2000, pp. 1326-1330
Atlas fractures
Authors: Scharen, S Jeanneret, B
Citation: S. Scharen et B. Jeanneret, Atlas fractures, ORTHOPADE, 28(5), 1999, pp. 385-393
Comments on "Influence of voltage contacts on precision measurements of the quantized Hall resistance: An effect of externally injected current"
Authors: Jeanneret, B Jeckelmann, B
Citation: B. Jeanneret et B. Jeckelmann, Comments on "Influence of voltage contacts on precision measurements of the quantized Hall resistance: An effect of externally injected current", IEEE INSTR, 48(5), 1999, pp. 1010-1010
A proposal for a new moving-coil experiment
Authors: Beer, W Jeanneret, B Jeckelmann, B Richard, P Courteville, A Salvade, Y Dandliker, R
Citation: W. Beer et al., A proposal for a new moving-coil experiment, IEEE INSTR, 48(2), 1999, pp. 192-195
Contactless measurements of the internal capacitance of a Corbino ring in the quantum Hall regime
Authors: Jeanneret, B Jeckelmann, B Hall, BD
Citation: B. Jeanneret et al., Contactless measurements of the internal capacitance of a Corbino ring in the quantum Hall regime, IEEE INSTR, 48(2), 1999, pp. 301-304
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