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Results: 1-4 |
Results: 4
Total dose performance at 77K of a radiation hard 0.35 mu m CMOS SOI technology
Authors: Jenkins, WC Liu, ST
Citation: Wc. Jenkins et St. Liu, Total dose performance at 77K of a radiation hard 0.35 mu m CMOS SOI technology, IEEE NUCL S, 47(6), 2000, pp. 2204-2207
Worst case total dose radiation response of 0.35 mu m SOICMOSFETs
Authors: Liu, ST Balster, S Sinha, S Jenkins, WC
Citation: St. Liu et al., Worst case total dose radiation response of 0.35 mu m SOICMOSFETs, IEEE NUCL S, 46(6), 1999, pp. 1817-1823
A 5 nm nitrided gate oxide for 0.25 mu m SOICMOS technologies
Authors: Liu, ST Fechner, P Balster, S Dougal, G Sinha, S Chen, H Shaw, G Yue, J Jenkins, WC Hughes, HL
Citation: St. Liu et al., A 5 nm nitrided gate oxide for 0.25 mu m SOICMOS technologies, IEEE NUCL S, 46(6), 1999, pp. 1824-1829
Total dose radiation hard 0.35 mu m SOI CMOS technology
Authors: Liu, ST Jenkins, WC Hughes, HL
Citation: St. Liu et al., Total dose radiation hard 0.35 mu m SOI CMOS technology, IEEE NUCL S, 45(6), 1998, pp. 2442-2449
Risultati: 1-4 |