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Results: 1-3 |
Results: 3
Correlation between charge pumping method and direct-current current voltage method in p-type metal-oxide-semiconductor field-effect transistors
Authors: Jie, BB Ng, KH Li, MF Lo, KF
Citation: Bb. Jie et al., Correlation between charge pumping method and direct-current current voltage method in p-type metal-oxide-semiconductor field-effect transistors, JPN J A P 1, 38(8), 1999, pp. 4696-4698
Nondestructive DCIV method to evaluate plasma charging damage in ultrathingate oxides
Authors: Guan, H Zhang, YH Jie, BB He, YD Li, MF Dong, Z Xie, J Wang, JLF Yen, AC Sheng, GTT Li, WD
Citation: H. Guan et al., Nondestructive DCIV method to evaluate plasma charging damage in ultrathingate oxides, IEEE ELEC D, 20(5), 1999, pp. 238-240
DC voltage-voltage method to measure the interface traps in sub-micron MOSTs
Authors: Jie, BB Li, MF Chim, WK Chan, DSH Lo, KF
Citation: Bb. Jie et al., DC voltage-voltage method to measure the interface traps in sub-micron MOSTs, SEMIC SCI T, 14(7), 1999, pp. 621-627
Risultati: 1-3 |