Citation: W. Jo, Structural and ferroelectric properties of Bi4Ti3O12 thin films on IrO2 prepared by rf magnetron sputtering, APPL PHYS A, 72(1), 2001, pp. 81-84
Authors:
Jo, W
Peng, LSJ
Wang, W
Ohnishi, T
Marshall, AF
Hammond, RH
Beasley, MR
Peterson, EJ
Citation: W. Jo et al., Thermodynamic stability and kinetics of Y-Ba-Cu-O film growth at high rates in atomic and molecular oxygen, J CRYST GR, 225(2-4), 2001, pp. 183-189
Citation: W. Jo et al., Reverse-poling effects on charge retention in Pb(Zr,Ti)O-3(001)/LaNiO3(001) heterostructures, APPL PHYS L, 76(3), 2000, pp. 390-392
Citation: Mc. Jung et al., X-ray photoelectron spectroscopy study of Pt-oxide thin films deposited byreactive sputtering using O-2/Ar gas mixtures, JPN J A P 1, 38(8), 1999, pp. 4872-4875
Citation: W. Jo et al., Effect of oxygen to argon ratio on growth of Bi4Ti3O12 thin films on Ir and IrO2 prepared by radio-frequency magnetron sputtering, JPN J A P 1, 38(5A), 1999, pp. 2827-2830
Authors:
Kim, DC
Nam, HJ
Jo, W
Lee, HM
Cho, SM
Bu, JU
Kang, HB
Citation: Dc. Kim et al., Integration of a split word line ferroelectric memory using a novel etching technology, INTEGR FERR, 27(1-4), 1999, pp. 1323-1334
Authors:
Bu, SD
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Noh, TW
Jo, W
Citation: Sd. Bu et al., Influence of the laser fluence on the electrical properties of pulsed-laser-deposited SrBi2Ta2O9 thin films, APPL PHYS L, 75(8), 1999, pp. 1155-1157
Authors:
Hong, JW
Jo, W
Kim, DC
Cho, SM
Nam, HJ
Lee, HM
Bu, JU
Citation: Jw. Hong et al., Nanoscale investigation of domain retention in preferentially oriented PbZr0.53Ti0.47O3 thin films on Pt and on LaNiO3, APPL PHYS L, 75(20), 1999, pp. 3183-3185