Authors: Jolly, F Rochet, F Dufour, G Grupp, C Taleb-Ibrahimi, A

Citation: F. Jolly et al., Oxidized silicon surfaces studied by high resolution Si 2p core-level photoelectron spectroscopy using synchrotron radiation, J NON-CRYST, 280(1-3), 2001, pp. 150-155

Authors: Bournel, F Jolly, F Rochet, F Dufour, G Sirotti, F Torelli, P

Citation: F. Bournel et al., Core-electron spectroscopy of nonconjugated linear dienes chemisorbed on Si(001)-2X1 with synchrotron radiation, PHYS REV B, 62(11), 2000, pp. 7645-7653

Authors: Jolly, F Rochet, F Dufour, G Grupp, C Taleb-Ibrahimi, A

Citation: F. Jolly et al., Oxidation of the H-Si(111)-1 x 1 surface: high resolution Si 2p core-levelspectroscopy with synchrotron radiation, SURF SCI, 463(2), 2000, pp. 102-108

Authors: Jolly, F Bournel, F Rochet, F Dufour, G Sirotti, F Taleb, A

Citation: F. Jolly et al., Soft-x-ray photoelectron, x-ray absorption, and autoionization spectroscopy of 1,5-cyclooctadiene on Si(001)-2 x 1, PHYS REV B, 60(4), 1999, pp. 2930-2940

Authors: Jolly, F Cantin, JL Rochet, F Dufour, G von Bardeleben, HJ

Citation: F. Jolly et al., Temperature effects on the Si/SiO2 interface defects and suboxide distribution, J NON-CRYST, 245, 1999, pp. 217-223