Authors:
Szuszkiewicz, W
Bak-Misiuk, J
Dynowska, E
Jouanne, M
Morhange, JF
Wissmann, H
Anh, TT
von Ortenberg, M
Citation: W. Szuszkiewicz et al., Structural characterization of MBE-grown HgSe : Fe layers: X-ray diffraction and Raman spectroscopy, J CRYST GR, 214, 2000, pp. 269-274
Authors:
Picquart, M
Haro-Poniatowski, E
Morhange, JF
Jouanne, M
Kanehisa, M
Citation: M. Picquart et al., Low frequency vibrations and structural characterization of a murine IgG2amonoclonal antibody studied by Raman and IR spectroscopies, BIOPOLYMERS, 53(4), 2000, pp. 342-349
Authors:
Szuszkiewicz, W
Hennion, B
Jouanne, M
Morhange, JF
Dynowska, E
Janik, E
Wojtowicz, T
Citation: W. Szuszkiewicz et al., Selected properties of AFM-III structures - cubic MnTe and diluted magnetic semiconductors: CdMnTe and MgMnTe, J MAGN MAGN, 197, 1999, pp. 425-427