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Results:
1-17
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Results: 17
Authors:
Luitz, J
Maier, M
Hebert, C
Schattschneider, P
Blaha, P
Schwarz, K
Jouffrey, B
Citation: J. Luitz et al., Partial core hole screening in the Cu L-3 edge, EUR PHY J B, 21(3), 2001, pp. 363-367
Authors:
Hamon, AL
Marraud, A
Jouffrey, B
Citation: Al. Hamon et al., A geometrical study of single-walled nanotube ropes by transmission electron microscopy, PHIL MAG B, 81(11), 2001, pp. 1779-1799
Authors:
Hebert, C
Clair, S
Eisenmenger-Sittner, C
Bangert, H
Jouffrey, B
Schattschneider, P
Citation: C. Hebert et al., Electron energy-loss spectroscopy fine structure of the Cu L-2,L-3 ionization edge in substitutional Cu-Ni alloys, J PHYS-COND, 13(16), 2001, pp. 3791-3803
Authors:
Schattschneider, P
Hebert, C
Jouffrey, B
Citation: P. Schattschneider et al., Orientation dependence of ionization edges in EELS, ULTRAMICROS, 86(3-4), 2001, pp. 343-353
Authors:
Hebert-Souche, C
Bernardi, J
Schattschneider, P
Fidler, J
Jouffrey, B
Citation: C. Hebert-souche et al., Phase analysis of nanocomposite magnetic materials by electron energy lossspectrometry, EPJ-APPL PH, 9(2), 2000, pp. 147-151
Authors:
Jouffrey, B
Egerton, R
Citation: B. Jouffrey et R. Egerton, 14th International Congress on Electron Microscopy (EELS/ELNES/EXELFS special issue), MICRON, 31(4), 2000, pp. 323-323
Authors:
Schattschneider, P
Nelhiebel, M
Souchay, H
Jouffrey, B
Citation: P. Schattschneider et al., The physical significance of the mixed dynamic form factor, MICRON, 31(4), 2000, pp. 333-345
Authors:
Stoger, M
Nelhiebel, M
Schattschneider, P
Schlosser, V
Breymesser, A
Jouffrey, B
Citation: M. Stoger et al., EELS microanalysis of polycrystalline silicon thin films for solar cells grown at low temperatures, SOL EN MAT, 63(2), 2000, pp. 177-184
Authors:
Hebert-Souche, C
Louf, PH
Blaha, P
Nelheibel, M
Luitz, J
Schattschneider, P
Schwarz, K
Jouffrey, B
Citation: C. Hebert-souche et al., The orientation-dependent simulation of ELNES, ULTRAMICROS, 83(1-2), 2000, pp. 9-16
Authors:
Nelhiebel, M
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., Observation of ionization in a crystal interferometer, PHYS REV L, 85(9), 2000, pp. 1847-1850
Authors:
Lefort, MH
Djafari, V
Jouffrey, B
Savary, C
Citation: Mh. Lefort et al., Thick film piezoresistive ink: effect of sintering under partial pressure of oxygen, MICROELEC J, 31(6), 2000, pp. 411-417
Authors:
Laude, T
Matsui, Y
Marraud, A
Jouffrey, B
Citation: T. Laude et al., Long ropes of boron nitride nanotubes grown by a continuous laser heating, APPL PHYS L, 76(22), 2000, pp. 3239-3241
Authors:
Nelhiebel, M
Luchier, N
Schorsch, P
Schattschneider, P
Jouffrey, B
Citation: M. Nelhiebel et al., The mixed dynamic form factor for atomic core-level excitations in interferometric electron-energy-loss experiments, PHIL MAG B, 79(6), 1999, pp. 941-953
Authors:
Jouffrey, B
Citation: B. Jouffrey, Homage to Professor Raimond Castaing, ULTRAMICROS, 76(3), 1999, pp. 87-89
Authors:
Nelhiebel, M
Louf, PH
Schattschneider, P
Blaha, P
Schwarz, K
Jouffrey, B
Citation: M. Nelhiebel et al., Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy, PHYS REV B, 59(20), 1999, pp. 12807-12814
Authors:
Schattschneider, P
Nelhiebel, M
Jouffrey, B
Citation: P. Schattschneider et al., Density matrix of inelastically scattered fast electrons, PHYS REV B, 59(16), 1999, pp. 10959-10969
Authors:
Souche, C
Jouffrey, B
Nelhiebel, M
Citation: C. Souche et al., Orientation sensitive EELS-analysis of boron nitride nanometric hollow spheres, MICRON, 29(6), 1998, pp. 419-424
Risultati:
1-17
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