AAAAAA

   
Results: 1-3 |
Results: 3
HIGH-ENERGY ION-IMPLANTATION FOR PROFILED TUB FORMATION AND IMPURITY GETTERING IN DEEP-SUBMICRON CMOS TECHNOLOGY
Authors: JACOBSON DC KAMGAR A EAGLESHAM DJ LLOYD EJ HILLENIUS SJ POATE JM
Citation: Dc. Jacobson et al., HIGH-ENERGY ION-IMPLANTATION FOR PROFILED TUB FORMATION AND IMPURITY GETTERING IN DEEP-SUBMICRON CMOS TECHNOLOGY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 96(1-2), 1995, pp. 416-419
GATE OXIDE THINNING AT THE ACTIVE DEVICE FOX BOUNDARY IN SUBMICROMETER PBL ISOLATION/
Authors: KAMGAR A HILLENIUS SJ BAKER RM NAKAHARA S BECHTOLD PF
Citation: A. Kamgar et al., GATE OXIDE THINNING AT THE ACTIVE DEVICE FOX BOUNDARY IN SUBMICROMETER PBL ISOLATION/, I.E.E.E. transactions on electron devices, 42(12), 1995, pp. 2089-2095
PLOTSIZE AND SAMPLE NUMBER FOR NEUTRON PROBE MEASUREMENTS IN SMALL-FIELD TRIALS
Authors: KAMGAR A HOPMANS JW WALLENDER WW WENDROTH O
Citation: A. Kamgar et al., PLOTSIZE AND SAMPLE NUMBER FOR NEUTRON PROBE MEASUREMENTS IN SMALL-FIELD TRIALS, Soil science, 156(4), 1993, pp. 213-224
Risultati: 1-3 |