Authors:
STRACHAN WJ
REINER J
GOODHUE WD
KARAKASHIAN AS
CASASANTA V
GELLER JD
Citation: Wj. Strachan et al., ANALYSIS OF MOLECULAR-BEAM EPITAXY-GROWN GA1-XALXAS GA1-YALYAS DIELECTRIC STACK MIRRORS USING COMPLEX INDEXES OF REFRACTION/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2318-2321
Citation: Sd. Chen et al., THE STARK-EFFECT FOR SURFACE-STATES IN A FINITE SUPERLATTICE STRUCTURE, Physica. B, Condensed matter, 228(3-4), 1996, pp. 239-244
Citation: Ar. Frederickson et As. Karakashian, CAPACITANCE-VOLTAGE MEASUREMENT OF CHARGED DEFECT CONCENTRATION PROFILE NEAR SEMICONDUCTOR DEPLETION ZONES, Journal of applied physics, 77(4), 1995, pp. 1627-1634