Authors: SIAPKAS DI HATZOPOULOS N KATSIDIS CC ZORBA T MITSAS CL HEMMENT PLF

Citation: Di. Siapkas et al., STRUCTURAL AND COMPOSITIONAL CHARACTERIZATION OF HIGH-ENERGY SEPARATION BY IMPLANTATION OF OXYGEN STRUCTURES USING INFRARED-SPECTROSCOPY, Journal of the Electrochemical Society, 143(9), 1996, pp. 3019-3032

Authors: ZORBA T SIAPKAS DI KATSIDIS CC

Citation: T. Zorba et al., OPTICAL CHARACTERIZATION OF THIN AND ULTRATHIN SURFACE AND BURIED CUBIC SIC LAYERS USING FTIR SPECTROSCOPY, Microelectronic engineering, 28(1-4), 1995, pp. 229-232

Authors: KATSIDIS CC SIAPKAS DI PANKNIN D HATZOPOULOS N SKORUPA W

Citation: Cc. Katsidis et al., OPTICAL CHARACTERIZATION OF DOPED SIMOX STRUCTURES USING FTIR SPECTROSCOPY, Microelectronic engineering, 28(1-4), 1995, pp. 439-442