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Results: 1-9 |
Results: 9
SINTERING OF (PB,LA)(ZR,TI)O-3 IN OZONE ATMOSPHERE AND ITS FERROELECTRIC PROPERTIES
Authors: KAWAZU Y TSUZUKI K
Citation: Y. Kawazu et K. Tsuzuki, SINTERING OF (PB,LA)(ZR,TI)O-3 IN OZONE ATMOSPHERE AND ITS FERROELECTRIC PROPERTIES, JPN J A P 1, 35(9B), 1996, pp. 5117-5121
SUPPRESSION OF TEMPERATURE-SENSITIVE DEFECTS OF POLYPEPTIDE RELEASE FACTORS RF-1 AND RF-2 BY MUTATIONS OR BY AN EXCESS OF RF-3 IN ESCHERICHIA-COLI
Authors: MATSUMURA K ITO K KAWAZU Y MIKUNI O NAKAMURA Y
Citation: K. Matsumura et al., SUPPRESSION OF TEMPERATURE-SENSITIVE DEFECTS OF POLYPEPTIDE RELEASE FACTORS RF-1 AND RF-2 BY MUTATIONS OR BY AN EXCESS OF RF-3 IN ESCHERICHIA-COLI, Journal of Molecular Biology, 258(4), 1996, pp. 588-599
ELECTROCHEMICAL-BEHAVIOR OF ELECTRODES MODIFIED WITH PI-CONJUGATED POLYMERS IN 0.5 M H2SO4 (AQ) AND 1 M KOH (AQ) ELECTROLYTES
Authors: YAMAMOTO T MATSUZAKI T MINETOMO A KAWAZU Y OHASHI O
Citation: T. Yamamoto et al., ELECTROCHEMICAL-BEHAVIOR OF ELECTRODES MODIFIED WITH PI-CONJUGATED POLYMERS IN 0.5 M H2SO4 (AQ) AND 1 M KOH (AQ) ELECTROLYTES, Bulletin of the Chemical Society of Japan, 69(12), 1996, pp. 3461-3468
REGULATION OF TRANSLATION TERMINATION - CONSERVED STRUCTURAL MOTIFS IN BACTERIAL AND EUKARYOTIC POLYPEPTIDE RELEASE FACTORS
Authors: NAKAMURA Y ITO K MATSUMURA K KAWAZU Y EBIHARA K
Citation: Y. Nakamura et al., REGULATION OF TRANSLATION TERMINATION - CONSERVED STRUCTURAL MOTIFS IN BACTERIAL AND EUKARYOTIC POLYPEPTIDE RELEASE FACTORS, Biochemistry and cell biology, 73(11-12), 1995, pp. 1113-1122
COMPARATIVE CHARACTERIZATION OF RELEASE FACTOR RF-3 GENES OF ESCHERICHIA-COLI, SALMONELLA-TYPHIMURIUM, AND DICHELOBACTER-NODOSUS
Authors: KAWAZU Y ITO K MATSUMURA K NAKAMURA Y
Citation: Y. Kawazu et al., COMPARATIVE CHARACTERIZATION OF RELEASE FACTOR RF-3 GENES OF ESCHERICHIA-COLI, SALMONELLA-TYPHIMURIUM, AND DICHELOBACTER-NODOSUS, Journal of bacteriology, 177(19), 1995, pp. 5547-5553
HIGHLY RELIABLE FLASH MEMORIES FABRICATED BY IN-SITU MULTIPLE RAPID THERMAL-PROCESSING
Authors: HAYASHI T KAWAZU Y UCHIYAMA A FUKUDA H
Citation: T. Hayashi et al., HIGHLY RELIABLE FLASH MEMORIES FABRICATED BY IN-SITU MULTIPLE RAPID THERMAL-PROCESSING, IEICE transactions on electronics, E77C(8), 1994, pp. 1270-1278
NOVEL ELFIN (EMBEDDED-METAL-LAYER PROCESS FOR FULLY INTEGRATED NOR) CELL FOR 16 64 MBIT FLASH EEPROM/
Authors: KAWAZU Y HAYASHI T OHNO M ONO T UCHIYAMA A
Citation: Y. Kawazu et al., NOVEL ELFIN (EMBEDDED-METAL-LAYER PROCESS FOR FULLY INTEGRATED NOR) CELL FOR 16 64 MBIT FLASH EEPROM/, Electronics Letters, 30(15), 1994, pp. 1209-1210
HIGH-PERFORMANCE SCALED FLASH-TYPE EEPROMS FABRICATED BY IN-SITU MULTIPLE RAPID THERMAL-PROCESSING
Authors: HAYASHI T KAWAZU Y FUKUDA H IWABUCHI T
Citation: T. Hayashi et al., HIGH-PERFORMANCE SCALED FLASH-TYPE EEPROMS FABRICATED BY IN-SITU MULTIPLE RAPID THERMAL-PROCESSING, Electronics Letters, 29(25), 1993, pp. 2178-2179
CHARACTERIZATION OF POLY-SI SIO2/SI(100) STRUCTURE BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY/
Authors: KAWAZU Y FUKUDA H HAYASHI T IWABUCHI T
Citation: Y. Kawazu et al., CHARACTERIZATION OF POLY-SI SIO2/SI(100) STRUCTURE BY VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY/, Electronics Letters, 29(20), 1993, pp. 1758-1759
Risultati: 1-9 |