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Citation: Mj. Kivi et S. Taylor, EFFECTS OF OXIDE FIELD DURING SHE INJECTION AS STUDIED BY 3 LEVEL CHARGE-PUMPING, Microelectronics, 27(7), 1996, pp. 687-691

Authors: THEWES R KIVI MJ GOSER KF WEBER W

Citation: R. Thewes et al., EVALUATION OF THE HOT-CARRIER-INDUCED OFFSET VOLTAGE OF DIFFERENTIAL PAIRS IN ANALOG CMOS CIRCUITS, Quality and reliability engineering international, 11(4), 1995, pp. 273-277