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Results: 1-19 |
Results: 19
POLARIZATION OF THE 61ST HARMONIC FROM 1053-NM LASER-RADIATION IN NEON
Authors: SCHULZE D DORR M SOMMERER G LUDWIG J NICKLES PV SCHLEGEL T SANDNER W DRESCHER M KLEINEBERG U HEINZMANN U
Citation: D. Schulze et al., POLARIZATION OF THE 61ST HARMONIC FROM 1053-NM LASER-RADIATION IN NEON, Physical review. A, 57(4), 1998, pp. 3003-3007
STM WRITING OF ARTIFICIAL NANOSTRUCTURES IN ULTRATHIN PMMA AND SAM RESISTS AND SUBSEQUENT PATTERN TRANSFER IN A MO SI MULTILAYER BY REACTIVE ION ETCHING/
Authors: HARTWICH J DREESKORNFELD L HEISIG V RAHN S WEHMEYER O KLEINEBERG U HEINZMANN U
Citation: J. Hartwich et al., STM WRITING OF ARTIFICIAL NANOSTRUCTURES IN ULTRATHIN PMMA AND SAM RESISTS AND SUBSEQUENT PATTERN TRANSFER IN A MO SI MULTILAYER BY REACTIVE ION ETCHING/, Applied physics A: Materials science & processing, 66, 1998, pp. 685-688
X-RAY-SCATTERING STUDY OF INTERFACE ROUGHNESS CORRELATION IN MO SI AND TI/C MULTILAYERS FOR X-UV OPTICS/
Authors: JERGEL M HOLY V MAJKOVA E LUBY S SENDERAK R STOCK HJ MENKE D KLEINEBERG U HEINZMANN U
Citation: M. Jergel et al., X-RAY-SCATTERING STUDY OF INTERFACE ROUGHNESS CORRELATION IN MO SI AND TI/C MULTILAYERS FOR X-UV OPTICS/, Physica. B, Condensed matter, 253(1-2), 1998, pp. 28-39
CHEMICAL MICROANALYSIS BY SELECTED-AREA ESCA USING AN ELECTRON-ENERGYFILTER IN A PHOTOEMISSION MICROSCOPE
Authors: SCHMIDT O ZIETHEN C FECHER GH MERKEL M ESCHER M MENKE D KLEINEBERG U HEINZMANN U SCHONHENSE G
Citation: O. Schmidt et al., CHEMICAL MICROANALYSIS BY SELECTED-AREA ESCA USING AN ELECTRON-ENERGYFILTER IN A PHOTOEMISSION MICROSCOPE, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 1009-1014
TIME-OF-FLIGHT PHOTOELECTRON EMISSION MICROSCOPY TOF-PEEM - FIRST RESULTS
Authors: SPIECKER H SCHMIDT O ZIETHEN C MENKE D KLEINEBERG U AHUJA RC MERKEL M HEINZMANN U SCHONHENSE G
Citation: H. Spiecker et al., TIME-OF-FLIGHT PHOTOELECTRON EMISSION MICROSCOPY TOF-PEEM - FIRST RESULTS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 406(3), 1998, pp. 499-506
CARBON TITANIUM MULTILAYERS AS SOFT-X-RAY MIRRORS FOR THE WATER WINDOW/
Authors: STOCK HJ HAINDL G HAMELMANN F MENKE D WEHMEYER O KLEINEBERG U HEINZMANN U BULICKE P FUCHS D ULM G
Citation: Hj. Stock et al., CARBON TITANIUM MULTILAYERS AS SOFT-X-RAY MIRRORS FOR THE WATER WINDOW/, Applied optics, 37(25), 1998, pp. 6002-6005
EFFICIENCY OF A MULTILAYER-COATED, ION-ETCHED LAMINAR HOLOGRAPHIC GRATING IN THE 14.5-16.0-NM WAVELENGTH REGION
Authors: KOWALSKI MP CRUDDACE RG SEELY JF RIFE JC HEIDEMANN KF HEINZMANN U KLEINEBERG U OSTERRIED K MENKE D HUNTER WR
Citation: Mp. Kowalski et al., EFFICIENCY OF A MULTILAYER-COATED, ION-ETCHED LAMINAR HOLOGRAPHIC GRATING IN THE 14.5-16.0-NM WAVELENGTH REGION, Optics letters, 22(11), 1997, pp. 834-836
CHARACTERIZATION OF THE HELICAL UNDULATOR HELIOS-I IN THE 520 TO 930 EV RANGE USING A MULTILAYER POLARIMETER
Authors: DRESCHER M SNELL G KLEINEBERG U STOCK HJ MULLER N HEINZMANN U BROOKES NB
Citation: M. Drescher et al., CHARACTERIZATION OF THE HELICAL UNDULATOR HELIOS-I IN THE 520 TO 930 EV RANGE USING A MULTILAYER POLARIMETER, Review of scientific instruments, 68(5), 1997, pp. 1939-1944
THERMAL-STABILITY OF W1-XSIX SI MULTILAYERS UNDER RAPID THERMAL ANNEALING/
Authors: SENDERAK R JERGEL M LUBY S MAJKOVA E HOLY V HAINDL G HAMELMANN F KLEINEBERG U HEINZMANN U
Citation: R. Senderak et al., THERMAL-STABILITY OF W1-XSIX SI MULTILAYERS UNDER RAPID THERMAL ANNEALING/, Journal of applied physics, 81(5), 1997, pp. 2229-2235
CARBON BUFFER LAYERS FOR SMOOTHING SUPERPOLISHED GLASS SURFACES AS SUBSTRATES FOR MOLYBDENUM SILICON MULTILAYER SOFT-X-RAY MIRRORS/
Authors: STOCK HJ HAMELMANN F KLEINEBERG U MENKE D SCHMIEDESKAMP B OSTERRIED K HEIDEMANN KF HEINZMANN U
Citation: Hj. Stock et al., CARBON BUFFER LAYERS FOR SMOOTHING SUPERPOLISHED GLASS SURFACES AS SUBSTRATES FOR MOLYBDENUM SILICON MULTILAYER SOFT-X-RAY MIRRORS/, Applied optics, 36(7), 1997, pp. 1650-1654
MULTILAYER-COATED LAMINAR GRATING WITH 16-PERCENT NORMAL-INCIDENCE EFFICIENCY IN THE 150-ANGSTROM WAVELENGTH REGION
Authors: SEELY JF KOWALSKI MP CRUDDACE RG HEIDEMANN KF HEINZMANN U KLEINEBERG U OSTERRIED K MENKE D RIFE JC HUNTER WR
Citation: Jf. Seely et al., MULTILAYER-COATED LAMINAR GRATING WITH 16-PERCENT NORMAL-INCIDENCE EFFICIENCY IN THE 150-ANGSTROM WAVELENGTH REGION, Applied optics, 36(31), 1997, pp. 8206-8213
MO SI MULTILAYER COATED LAMINAR PHASE AND RULED BLAZE GRATINGS FOR THE SOFT-X-RAY REGION/
Authors: KLEINEBERG U STOCK HJ KLOIDT A OSTERRIED K MENKE D SCHMIEDESKAMP B HEINZMANN U FUCHS D MULLER P SCHOLZE F ULM G HEIDEMANN KF NELLES B
Citation: U. Kleineberg et al., MO SI MULTILAYER COATED LAMINAR PHASE AND RULED BLAZE GRATINGS FOR THE SOFT-X-RAY REGION/, Journal of electron spectroscopy and related phenomena, 80, 1996, pp. 389-392
THERMAL-STABILITY OF W1-XSIX SI MULTILAYER REFLECTIVE COATINGS UNDER HIGH-INTENSITY EXCIMER-LASER PULSES/
Authors: DANNA E LUCHES A MARTINO M BRUNEL M MAJKOVA E LUBY S SENDERAK R JERGEL M HAMELMANN F KLEINEBERG U HEINZMANN U
Citation: E. Danna et al., THERMAL-STABILITY OF W1-XSIX SI MULTILAYER REFLECTIVE COATINGS UNDER HIGH-INTENSITY EXCIMER-LASER PULSES/, Applied surface science, 106, 1996, pp. 166-170
MO SI MULTILAYER-COATED RULED BLAZED GRATINGS FOR THE SOFT-X-RAY REGION/
Authors: KLEINEBERG U OSTERRIED K STOCK HJ MENKE D SCHMIEDESKAMP B FUCH D MULLER P SCHOLZE F HEIDEMANN KF NELLES B HEINZMANN U
Citation: U. Kleineberg et al., MO SI MULTILAYER-COATED RULED BLAZED GRATINGS FOR THE SOFT-X-RAY REGION/, Applied optics, 34(28), 1995, pp. 6506-6512
THERMAL-STABILITY OF MO SI MULTILAYER SOFT-X-RAY MIRRORS FABRICATED BY ELECTRON-BEAM EVAPORATION/
Authors: STOCK HJ KLEINEBERG U HEIDEMANN B HILGERS K KLOIDT A SCHMIEDESKAMP B HEINZMANN U KRUMREY M MULLER P SCHOLZE F
Citation: Hj. Stock et al., THERMAL-STABILITY OF MO SI MULTILAYER SOFT-X-RAY MIRRORS FABRICATED BY ELECTRON-BEAM EVAPORATION/, Applied physics. A, Solids and surfaces, 58(4), 1994, pp. 371-376
ELECTRON-BEAM-DEPOSITED MO SI AND MO(X)SI(Y)/SI MULTILAYER X-RAY MIRRORS AND GRATINGS/
Authors: SCHMIEDESKAMP B KLOIDT A STOCK HJ KLEINEBERG U DOHRING T PROPPER M RAHN S HILGERS K HEIDEMANN B TAPPE T HEINZMANN U KRUMREY MK MULLER P SCHOLZE F HEIDEMANN KF
Citation: B. Schmiedeskamp et al., ELECTRON-BEAM-DEPOSITED MO SI AND MO(X)SI(Y)/SI MULTILAYER X-RAY MIRRORS AND GRATINGS/, Optical engineering, 33(4), 1994, pp. 1314-1321
INTERFACE STABILITY AND SILICIDE FORMATION IN HIGH-TEMPERATURE STABLEMOXSI1-X SI MULTILAYER SOFT-X-RAY MIRRORS STUDIED BY MEANS OF X-RAY-DIFFRACTION AND HRTEM/
Authors: KLEINEBERG U STOCK HJ KLOIDT A SCHMIEDESKAMP B HEINZMANN U HOPFE S SCHOLZ R
Citation: U. Kleineberg et al., INTERFACE STABILITY AND SILICIDE FORMATION IN HIGH-TEMPERATURE STABLEMOXSI1-X SI MULTILAYER SOFT-X-RAY MIRRORS STUDIED BY MEANS OF X-RAY-DIFFRACTION AND HRTEM/, Physica status solidi. a, Applied research, 145(2), 1994, pp. 539-550
SMOOTHING OF INTERFACES IN ULTRATHIN MO SI MULTILAYERS BY ION-BOMBARDMENT/
Authors: KLOIDT A STOCK HJ KLEINEBERG U DOHRING T PROPPER M SCHMIEDESKAMP B HEINZMANN U
Citation: A. Kloidt et al., SMOOTHING OF INTERFACES IN ULTRATHIN MO SI MULTILAYERS BY ION-BOMBARDMENT/, Thin solid films, 228(1-2), 1993, pp. 154-157
MO0.5SI0.5 SI MULTILAYER SOFT-X-RAY MIRRORS, HIGH THERMAL-STABILITY, AND NORMAL INCIDENCE REFLECTIVITY/
Authors: STOCK HJ KLEINEBERG U KLOIDT A SCHMIEDESKAMP B HEINZMANN U KRUMREY M MULLER P SCHOLZE F
Citation: Hj. Stock et al., MO0.5SI0.5 SI MULTILAYER SOFT-X-RAY MIRRORS, HIGH THERMAL-STABILITY, AND NORMAL INCIDENCE REFLECTIVITY/, Applied physics letters, 63(16), 1993, pp. 2207-2209
Risultati: 1-19 |