Authors: KLIMOVSKAYA AI OSTROVSKII IP FADEYEV SV FRUGINSKII MS RUDYI IO

Citation: Ai. Klimovskaya et al., LATTICE-PARAMETER CHANGE IN SUBMICRON SI WHISKERS, Thin solid films, 319(1-2), 1998, pp. 84-86

Authors: GULE YG RUDKO GY KLIMOVSKAYA AI VALAKH MY OSTROVSKII IP

Citation: Yg. Gule et al., VISIBLE-LIGHT EMISSION FROM FREESTANDING FILAMENT CRYSTALS OF SILICON, Physica status solidi. a, Applied research, 161(2), 1997, pp. 565-570

Authors: KLIMOVSKAYA AI

Citation: Ai. Klimovskaya, FREESTANDING SUBMICROMETER FILAMENT CRYSTALS OF SI AND GEXSI1-X, Microelectronics, 28(1), 1997, pp. 13-22

Authors: KLIMOVSKAYA AI OSTROVSKII IP OSTROVSKAYA AS

Citation: Ai. Klimovskaya et al., INFLUENCE OF GROWTH-CONDITIONS ON MORPHOLOGY, COMPOSITION, AND ELECTRICAL-PROPERTIES OF N-SI WIRES, Physica status solidi. a, Applied research, 153(2), 1996, pp. 465-472

Authors: KLIMOVSKAYA AI OSTROVSKII IP BAITSAR RI OSTROVSKAYA AS

Citation: Ai. Klimovskaya et al., X-RAY STUDY OF FREESTANDING FILAMENT CRYSTALS OF GEXSI1-X SOLID-SOLUTION, Journal of physics. Condensed matter, 7(7), 1995, pp. 1229-1234

Authors: KLIMOVSKAYA AI BAIZAR RI OSTROVSKIY IP

Citation: Ai. Klimovskaya et al., X-RAY-INVESTIGATION OF THE SILICON SUBMIC ROMETER WHISKERS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(11), 1993, pp. 210-213