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Results:
1-10
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Results: 10
Authors:
KOREN I
KOREN Z
Citation: I. Koren et Z. Koren, DEFECT TOLERANCE IN VLSI CIRCUITS - TECHNIQUES AND YIELD ANALYSIS, Proceedings of the IEEE, 86(9), 1998, pp. 1819-1836
Authors:
KOREN Z
KOREN I
Citation: Z. Koren et I. Koren, ON THE EFFECT OF FLOORPLANNING ON THE YIELD OF LARGE-AREA INTEGRATED-CIRCUITS, IEEE transactions on very large scale integration (VLSI) systems, 5(1), 1997, pp. 3-14
Authors:
GUTMAN EM
UNIGOVSKI Y
LEVKOVICH M
KOREN Z
AGHION E
DANGUR M
Citation: Em. Gutman et al., INFLUENCE OF TECHNOLOGICAL PARAMETERS OF PERMANENT-MOLD CASTING AND DIE-CASTING ON CREEP AND STRENGTH OF MG ALLOY AZ91D, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 234, 1997, pp. 880-883
Authors:
SIMUNIC D
KOREN Z
Citation: D. Simunic et Z. Koren, AN ELECTRIC-FIELD MEASUREMENT OF A SCANNING RADAR ANTENNA, Microwave journal, 40(9), 1997, pp. 124
Authors:
KOSLOFF D
SHERWOOD J
KOREN Z
MACHET E
FALKOVITZ Y
Citation: D. Kosloff et al., VELOCITY AND INTERFACE DEPTH DETERMINATION BY TOMOGRAPHY OF DEPTH MIGRATED GATHERS, Geophysics, 61(5), 1996, pp. 1511-1523
Authors:
STAVBER S
KOREN Z
ZUPAN M
Citation: S. Stavber et al., SELECTIVE, ROOM-TEMPERATURE, HIGH-YIELD CONVERSION OF BENZALDEHYDES TO DIFLUOROMETHOXY BENZENE-DERIVATIVES USING XENON DIFLUORIDE, Synlett, (4), 1994, pp. 265-266
Authors:
KOREN Z
Citation: Z. Koren, EUROPEAN PROJECT COST-244 - BIOMEDICAL EFFECTS OF ELECTROMAGNETIC-FIELDS, Bioelectrochemistry and bioenergetics, 35(1-2), 1994, pp. 180000011-180000013
THE HYETI DEFECT TOLERANT MICROPROCESSOR - A PRACTICAL EXPERIMENT ANDITS COST-EFFECTIVENESS ANALYSIS
Authors:
LEVEUGLE R
KOREN Z
KOREN I
SAUCIER G
Citation: R. Leveugle et al., THE HYETI DEFECT TOLERANT MICROPROCESSOR - A PRACTICAL EXPERIMENT ANDITS COST-EFFECTIVENESS ANALYSIS, I.E.E.E. transactions on computers, 43(12), 1994, pp. 1398-1406
Authors:
GANZ A
KOREN Z
Citation: A. Ganz et Z. Koren, PERFORMANCE AND DESIGN EVALUATION OF WDM STARS, Journal of lightwave technology, 11(2), 1993, pp. 358-366
Authors:
KOREN I
KOREN Z
STAPPER CH
Citation: I. Koren et al., A UNIFIED NEGATIVE-BINOMIAL DISTRIBUTION FOR YIELD ANALYSIS OF DEFECT-TOLERANT CIRCUITS, I.E.E.E. transactions on computers, 42(6), 1993, pp. 724-734
Risultati:
1-10
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