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Authors: FERRARI C KORYTAR D KUMAR J

Citation: C. Ferrari et al., STUDY OF RESIDUAL STRAINS IN WAFER CRYSTALS BY MEANS OF LATTICE TILT MAPPING, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 165-173

Authors: KORYTAR D BOHACEK P BESSE I FRANCESIO L MIKULA P

Citation: D. Korytar et al., MONOLITHIC DEVICES FOR HIGH-RESOLUTION X-RAY-DIFFRACTOMETRY AND TOPOGRAPHY, Nuovo cimento della Societa italiana di fisica. D, Condensed matter,atomic, molecular and chemical physics, biophysics, 19(2-4), 1997, pp. 481-488

Authors: BOHACEK P KREMPASKY M KORYTAR D SEKACOVA M SENDERAK R

Citation: P. Bohacek et al., MAPPING OF THE RESIDUAL VOLTAGE OF HALL DEVICES FABRICATED BY P+SI COIMPLANTATION ON GAAS WAFERS, Physica status solidi. a, Applied research, 155(2), 1996, pp. 381-387

Authors: KORYTAR D BESSE I BOHACEK P

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Authors: ATTOLINI G BOCCHI C FRANZOSI P KORYTAR D PELOSI C

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