Authors: KOSTER L

Citation: L. Koster, SHEAR-HEAD TECHNOLOGY - TECHNICAL STANDAR D AND FUTURE ASPECTS, Kautschuk und Gummi, Kunststoffe, 49(7-8), 1996, pp. 538-543

Authors: VONAMMON W DREIER P HENSEL W LAMBERT U KOSTER L

Citation: W. Vonammon et al., INFLUENCE OF OXYGEN AND NITROGEN ON POINT-DEFECT AGGREGATION IN SILICON SINGLE-CRYSTALS, Materials science & engineering. B, Solid-state materials for advanced technology, 36(1-3), 1996, pp. 33-41

Authors: FABRY L KOSTER L PAHLKE S KOTZ L HAGE J

Citation: L. Fabry et al., DIAGNOSTIC AND MONITORING TOOLS OF LARGE-SCALE SI-MANUFACTURING - TRACE-ANALYTICAL TOOLS AND TECHNIQUES IN SI-WAFER MANUFACTURING, IEEE transactions on semiconductor manufacturing, 9(3), 1996, pp. 428-436

Authors: KOSTER L BLOCHL P FABRY L

Citation: L. Koster et al., ELEMENT-SPECIFIC DIAGNOSIS USING MICROWAVE REFLECTION PHOTOCONDUCTIVEDECAY, JPN J A P 1, 34(2B), 1995, pp. 932-936