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Results: 1-7 |
Results: 7
ATOMIC SPECTROMETRY UPDATE - X-RAY-FLUORESCENCE SPECTROMETRY
Authors: ELLIS AT HOLMES M KREGSAMER P POTTS PJ STRELI C WEST M WOBRAUSCHEK P
Citation: At. Ellis et al., ATOMIC SPECTROMETRY UPDATE - X-RAY-FLUORESCENCE SPECTROMETRY, Journal of analytical atomic spectrometry (Print), 13(11), 1998, pp. 209-232
TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS WITH SYNCHROTRON-RADIATION AND SPECIAL X-RAY TUBES
Authors: STRELI C WOBRAUSCHEK P BAUER V KREGSAMER P GORGL R PIANETTA P RYON R PAHLKE S FABRY L
Citation: C. Streli et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS OF LIGHT-ELEMENTS WITH SYNCHROTRON-RADIATION AND SPECIAL X-RAY TUBES, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 861-872
ANALYSIS OF NI ON SI-WAFER SURFACES USING SYNCHROTRON-RADIATION EXCITED TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS
Authors: WOBRAUSCHEK P GORGL R KREGSAMER P STRELI C PAHLKE S FABRY L HALLER M KNOCHEL A RADTKE M
Citation: P. Wobrauschek et al., ANALYSIS OF NI ON SI-WAFER SURFACES USING SYNCHROTRON-RADIATION EXCITED TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 901-906
TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS EXCITED BY SYNCHROTRON-RADIATION (SR-TXRF) - VARIATION OF EXCITATION CONDITIONS AND SAMPLE GEOMETRIES
Authors: GORGL R WOBRAUSCHEK P KREGSAMER P STRELI C HALLER M KNOCHEL A RADTKE M
Citation: R. Gorgl et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS EXCITED BY SYNCHROTRON-RADIATION (SR-TXRF) - VARIATION OF EXCITATION CONDITIONS AND SAMPLE GEOMETRIES, X-ray spectrometry, 26(4), 1997, pp. 189-194
RECENT DEVELOPMENTS IN TXRF WITH VARIOUS EXCITATION SOURCES
Authors: WOBRAUSCHEK P STRELI C KREGSAMER P LADISICH W RIEDER R
Citation: P. Wobrauschek et al., RECENT DEVELOPMENTS IN TXRF WITH VARIOUS EXCITATION SOURCES, Journal of trace and microprobe techniques, 14(1), 1996, pp. 103-117
TXRF WITH SYNCHROTRON-RADIATION ANALYSIS OF NI ON SI-WAFER SURFACES
Authors: WOBRAUSCHEK P KREGSAMER P LADISICH W STRELI C PAHLKE S FABRY L GARBE S HALLER M KNOCHEL A RADTKE M
Citation: P. Wobrauschek et al., TXRF WITH SYNCHROTRON-RADIATION ANALYSIS OF NI ON SI-WAFER SURFACES, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 363(3), 1995, pp. 619-620
TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY OF METAL SAMPLES USING SYNCHROTRON-RADIATION AT SSRL
Authors: HEGEDUS F WOBRAUSCHEK P SOMMER WF RYON RW STRELI C WINKLER P FERGUSON P KREGSAMER P RIEDER R VICTORIA M HORSEWELL A
Citation: F. Hegedus et al., TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY OF METAL SAMPLES USING SYNCHROTRON-RADIATION AT SSRL, X-ray spectrometry, 22(4), 1993, pp. 277-280
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