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Results: 1-3 |
Results: 3
HALL-EFFECT CHARACTERIZATION OF LPE HGCDTE P N HETEROJUNCTIONS/
Authors: TOBIN SP PULTZ GN KRUEGER EE KESTIGIAN M WONG KK NORTON PW
Citation: Sp. Tobin et al., HALL-EFFECT CHARACTERIZATION OF LPE HGCDTE P N HETEROJUNCTIONS/, Journal of electronic materials, 22(8), 1993, pp. 907-914
X-RAY-DIFFRACTION CHARACTERIZATION OF LPE HGCDTE HETEROJUNCTION PHOTODIODE MATERIAL
Authors: TOBIN SP KRUEGER EE PULTZ GN KESTIGIAN M WONG KK NORTON PW
Citation: Sp. Tobin et al., X-RAY-DIFFRACTION CHARACTERIZATION OF LPE HGCDTE HETEROJUNCTION PHOTODIODE MATERIAL, Journal of electronic materials, 22(8), 1993, pp. 959-966
THE IMPACT OF CHARACTERIZATION TECHNIQUES ON HGCDTE INFRARED DETECTORTECHNOLOGY
Authors: REINE MB MASCHHOFF KR TOBIN SP NORTON PW MROCZKOWSKI JA KRUEGER EE
Citation: Mb. Reine et al., THE IMPACT OF CHARACTERIZATION TECHNIQUES ON HGCDTE INFRARED DETECTORTECHNOLOGY, Semiconductor science and technology, 8(6), 1993, pp. 788-804
Risultati: 1-3 |