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Results: 3
EDX DEPTH PROFILING BY MEANS OF EFFECTIVE LAYERS
Authors:
MYINT K BARFELS T KUHR JC FITTING HJ
Citation:
K. Myint et al., EDX DEPTH PROFILING BY MEANS OF EFFECTIVE LAYERS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 637-639
EDX DEPTHS ANALYSIS OF MIS-STRUCTURES
Authors:
FITTING HJ KUHR JC GOLDBERG M BECHER B BARFELS T
Citation:
Hj. Fitting et al., EDX DEPTHS ANALYSIS OF MIS-STRUCTURES, Mikrochimica acta, 125(1-4), 1997, pp. 235-238
HIGH-FIELD EBIC BY COMPUTER CONTROLLING
Authors:
HINGST T HUBNER M FRANZ R KUHR JC FITTING HJ
Citation:
T. Hingst et al., HIGH-FIELD EBIC BY COMPUTER CONTROLLING, Microelectronic engineering, 24(1-4), 1994, pp. 181-188
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1-3
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