Authors:
SHINADA T
KUMURA Y
OKABE J
MATSUKAWA T
OHDOMARI I
Citation: T. Shinada et al., CURRENT STATUS OF SINGLE-ION IMPLANTATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2489-2493
Citation: T. Shinada et al., DAMAGE AND CONTAMINATION FREE FABRICATION OF THIN SI WIRES WITH HIGHLY CONTROLLED FEATURE SIZE, Applied surface science, 117, 1997, pp. 684-689