Authors:
KURT R
PITSCHKE W
THOMAS J
WENDROCK H
BRUCKNER W
WETZIG K
Citation: R. Kurt et al., INVESTIGATION OF THE MICROSTRUCTURE OF IRSIX THIN-FILMS, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 609-613
Citation: E. Langer et al., INVESTIGATION OF DIVERGENT BEAM X-RAY REFLEX SECTIONS ESPECIALLY INDICATION BY COMPUTER-SIMULATION AND ASSIGNMENT TO THE GRAINS IN POLYCRYSTALLINE SAMPLES, Fresenius' journal of analytical chemistry, 361(6-7), 1998, pp. 728-732
Authors:
KURT R
PITSCHKE W
HEINRICH A
SCHUMANN J
THOMAS J
WETZIG K
BURKOV A
Citation: R. Kurt et al., PHASE-FORMATION PROCESS OF IRXSI1-X THIN-FILMS STRUCTURE AND ELECTRICAL-PROPERTIES, Thin solid films, 310(1-2), 1997, pp. 8-18
Citation: S. Dabritz et al., INVESTIGATION OF THE 3-DIMENSIONAL MICROSTRUCTURE OF CU-SN(PB) DIFFUSION ZONES BY MEANS OF ION-BEAM SPUTTERING, SCANNING ELECTRON-MICROSCOPY AND LATTICE SOURCE INTERFERENCES, Mikrochimica acta, 125(1-4), 1997, pp. 3-12
Authors:
PAGNI RM
KABALKA GW
HONDROGIANNIS G
BAINS S
ANOSIKE P
KURT R
Citation: Rm. Pagni et al., THE CYCLOADDITION REACTIONS OF UNSATURATED ESTERS WITH CYCLOPENTADIENE ON GAMMA-ALUMINA, Tetrahedron, 49(31), 1993, pp. 6743-6756