Authors: TAKEDA M OHWAKI T FUJII H KUSUMOTO E KAIHARA Y TAKAI Y SHIMIZU R

Citation: M. Takeda et al., INFLUENCE OF NATIVE OXIDES ON THE RELIABILITY OF ULTRATHIN GATE OXIDE, JPN J A P 1, 37(2), 1998, pp. 397-401

Authors: NAGATOMI T KAWANO T FUJII H KUSUMOTO E SHIMIZU R

Citation: T. Nagatomi et al., NEW ENERGY-LOSS FUNCTIONS FOR 1 KEV ELECTRONS INCIDENT ON CLEAN AND OXYGEN-ADSORBED SI(111) SURFACES, Surface science, 416(1-2), 1998, pp. 184-191

Authors: NAKAI J KUSUMOTO E KUWABARA M MIYAMOTO T VISOKAY MR YOSHIKAWA K ITAYAMA K

Citation: J. Nakai et al., RELATION BETWEEN MICROSTRUCTURE OF GRAIN-BOUNDARY AND THE INTERGRANULAR EXCHANGE IN COCRTA THIN-FILM FOR LONGITUDINAL RECORDING MEDIA, IEEE transactions on magnetics, 30(6), 1994, pp. 3969-3971