Authors: GUKASYAN A KVIT A KLEVKOV Y KAZARYAN S

Citation: A. Gukasyan et al., SPECTRAL MICROPHOTOLUMINESCENCE INVESTIGATION OF IMPURITY-DEFECT INTERACTION IN CDTE WITH HIGH-SPATIAL-RESOLUTION, Materials science & engineering. B, Solid-state materials for advanced technology, 47(1), 1997, pp. 87-89

Authors: GUKASYAN A KVIT A KLEVKOV Y OKTYABRSKY S

Citation: A. Gukasyan et al., HIGH-RESOLUTION PL CHARACTERIZATION OF IMPURITY SEGREGATION AND THEIRCOMPLEX-FORMATION ON EXTENDED DEFECTS IN CDTE, Solid state communications, 97(10), 1996, pp. 897-902

Authors: JOSHKIN V ORLIKOVSKY A OKTYABRSKY S DOVIDENKO K KVIT A MUHAMEDZANOV I PASHAEV E

Citation: V. Joshkin et al., BIAXIAL COMPRESSION IN GAAS THIN-FILMS GROWN ON SI, Journal of crystal growth, 147(1-2), 1995, pp. 13-18