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Results:
1-9
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Results: 9
Authors:
Kaczer, B
Degraeve, R
De Keersgieter, A
Rasras, M
Groeseneken, G
Citation: B. Kaczer et al., Explanation of nMOSFET substrate current after hard gate oxide breakdown, MICROEL ENG, 59(1-4), 2001, pp. 155-160
Authors:
Rasras, M
De Wolf, I
Groeseneken, G
Kaczer, B
Degraeve, R
Maes, HE
Citation: M. Rasras et al., Photo-carrier generation as the origin of Fowler-Nordheim-induced substrate hole current in thin oxides, IEEE DEVICE, 48(2), 2001, pp. 231-238
Authors:
Degraeve, R
Kaczer, B
Groeseneken, G
Citation: R. Degraeve et al., Reliability: a possible showstopper for oxide thickness scaling?, SEMIC SCI T, 15(5), 2000, pp. 436-444
Authors:
Degraeve, R
Kaczer, B
Groeseneken, G
Citation: R. Degraeve et al., Ultra-thin oxide reliability: searching for the thickness scaling limit, MICROEL REL, 40(4-5), 2000, pp. 697-701
Authors:
Kaczer, B
Degraeve, R
Pangon, N
Groeseneken, G
Citation: B. Kaczer et al., The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films, IEEE DEVICE, 47(7), 2000, pp. 1514-1521
Authors:
Kaczer, B
Jones, DE
Im, HJ
Pelz, JP
Citation: B. Kaczer et al., Ultrahigh vacuum dual fluid line rotatable connector, J VAC SCI A, 17(2), 1999, pp. 674-675
Authors:
Kaczer, B
Degraeve, R
Pangon, N
Nigam, T
Groeseneken, G
Citation: B. Kaczer et al., Investigation of temperature acceleration of thin oxide time-to-breakdown, MICROEL ENG, 48(1-4), 1999, pp. 47-50
Authors:
Degraeve, R
Kaczer, B
Groeseneken, G
Citation: R. Degraeve et al., Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction, MICROEL REL, 39(10), 1999, pp. 1445-1460
Authors:
Kaczer, B
Im, HJ
Pelz, JP
Wallace, RM
Citation: B. Kaczer et al., Microscopic characterization of hot-electron spreading and trapping in SiO2 films using ballistic electron emission microscopy (vol 73, pg 1871, 1998), APPL PHYS L, 74(3), 1999, pp. 478-478
Risultati:
1-9
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