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Citation: M. Grossmann et al., Influence of the measurement parameters on the reliability of ferroelectric thin films, INTEGR FERR, 32(1-4), 2001, pp. 693-701

Authors: Tiedke, S Schmitz, T Prume, K Roelofs, A Schneller, T Kall, U Waser, R Ganpule, CS Nagarajan, V Stanishevsky, A Ramesh, R

Citation: S. Tiedke et al., Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope, APPL PHYS L, 79(22), 2001, pp. 3678-3680