Authors: Kaschieva, S Alexandrova, S

Citation: S. Kaschieva et S. Alexandrova, High energy electron irradiation of ion implanted MOS structures with different oxide thickness, NUCL INST B, 174(3), 2001, pp. 324-328

Authors: Kaschieva, S Yourukov, I

Citation: S. Kaschieva et I. Yourukov, X-ray irradiation of ion-implanted MOS capacitors, NUCL INST B, 170(3-4), 2000, pp. 385-388